Inventor · disambiguated record
Jin Yi Lee
Also filed as: LEE JIN-YI
7 granted patents·31 citations·filing 2001–2019
77Inventor score
Top patents by PatentIndex Score
7 records- 0184US10788456B2Eddy current inspection device for nondestructive testingUNIV CHOSUN IACF·Filed 2017·Granted Sep 29, 2020·4 cites·8 claims
- 0277US6683452B2Magnetic flux density apparatus for, E.G., detecting an internal crack of a metal or a shape of the metalLACOMM CO LTD·Filed 2001·Granted Jan 27, 2004·25 cites·18 claims
- 0358US9182373B2Apparatus and method for detecting crack in small-bore piping systemUNIV CHOSUN IACF·Filed 2012·Granted Nov 10, 2015·1 cites·11 claims
- 0457US9279783B2Apparatus for detecting crack using heterogeneous magnetic sensorsUNIV CHOSUN IACF·Filed 2012·Granted Mar 8, 2016·1 cites·16 claims
- 0553US11169116B2Probe for nondestructive testing device using crossed gradient induced current and method for manufacturing induction coil for nondestructive testing deviceUNIV CHOSUN IACF·Filed 2019·Granted Nov 9, 2021·0 cites·11 claims
- 0650US10473730B2Defect detection device enabling easy removal of magnetic impuritiesUNIV CHOSUN IACF·Filed 2017·Granted Nov 12, 2019·0 cites·15 claims
- 0734US9170234B2Magnetic sensor array and apparatus for detecting defect using the magnetic sensor arrayLEE JIN-YI·Filed 2007·Granted Oct 27, 2015·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →