Inventor · disambiguated record
Jing-Yi Lin
Also filed as: LIN JING · LIN JING-YI
14 granted patents·7 pending applications·67 citations·filing 2004–2025
89Inventor score
Top patents by PatentIndex Score
21 records- 0198US11728227B1Test structure and test method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 15, 2023·8 cites·20 claims
- 0297US11342338B2Memory device with improved margin and performance and methods of formation thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 24, 2022·4 cites·20 claims
- 0388US11430788B2Integrated circuit with latch-up immunityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 30, 2022·2 cites·20 claims
- 0485US12374590B2Test structure and test method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 0585US7253061B2Method of forming a gate insulator in group III-V nitride semiconductor devicesTEKCORE CO LTD·Filed 2004·Granted Aug 7, 2007·30 cites·9 claims
- 0682US7977254B2Method of forming a gate insulator in group III-V nitride semiconductor devicesTEKCORE CO LTD·Filed 2007·Granted Jul 12, 2011·7 cites·10 claims
- 0782US2025365912A1Epitaxial features in semiconductor devices and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0881US11996338B2Test structure and test method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted May 28, 2024·0 cites·20 claims
- 0981US8474914B2Armrest adjustment deviceCHEN TE-CHUN·Filed 2011·Granted Jul 2, 2013·16 cites·11 claims
- 1080US2025098296A1Integrated circuit with latch-up immunityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1178US2024260249A1Memory Device with Improved Margin and Performance and Methods of Formation ThereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1275US11937416B2Memory device with improved margin and performance and methods of formation thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Mar 19, 2024·0 cites·20 claims
- 1373US2024371972A1Isolation structures in multi-gate semiconductor devices and methods of fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1472US12191306B2Integrated circuit with latch-up immunityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 7, 2025·0 cites·20 claims
- 1570US12495534B2Epitaxial features in semiconductor devices and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 9, 2025·0 cites·20 claims
- 1664US12080780B2Isolation structures in multi-gate semiconductor devices and methods of fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 3, 2024·0 cites·20 claims
- 1756US2024332408A1Isolation StructuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1855US11908910B2Semiconductor device having embedded conductive line and method of fabricating thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 20, 2024·0 cites·20 claims
- 1950US8975834B2Control circuit and illuminating device having different operation modesOSRAM GMBH·Filed 2013·Granted Mar 10, 2015·0 cites·18 claims
- 2048US2009305317A1User interface for testing deviceBRAUER JACOB S·Filed 2009·Application pending·0 cites
- 2140US2019371916A1Semiconductor structure having metal gate and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →