Inventor · disambiguated record
Jin Pan
Also filed as: PAN JIN · PAN JIN-YI
12 granted patents·5 pending applications·383 citations·filing 1998–2018
92Inventor score
Top patents by PatentIndex Score
17 records- 0191US6897666B2Embedded voltage regulator and active transient control device in probe head for improved power delivery and methodPRIMARION INC·Filed 2002·Granted May 24, 2005·84 cites·30 claims
- 0291US6147786AHybrid analog/digital WDM access network with mini-digital optical nodeNOKIA TELECOMMUNICATIONS OY·Filed 1998·Granted Nov 14, 2000·111 cites·28 claims
- 0386US8891235B2Thermal interface for multi-chip packagesWALCZYK JOSEPH F·Filed 2012·Granted Nov 18, 2014·13 cites·30 claims
- 0486US7274869B1System and method for providing destination-to-source protection switch setup in optical network topologiesNOKIA NETWORKS OY·Filed 1999·Granted Sep 25, 2007·98 cites·38 claims
- 0579US7345495B2Temperature and voltage controlled integrated circuit processesINTEL CORP·Filed 2004·Granted Mar 18, 2008·29 cites·41 claims
- 0677US10677845B2Converged test platforms and processes for class and system testing of integrated circuitsINTEL CORP·Filed 2017·Granted Jun 9, 2020·2 cites·28 claims
- 0772US8963135B2Integrated circuits and systems and methods for producing the sameINTEL CORP·Filed 2012·Granted Feb 24, 2015·9 cites·9 claims
- 0868US10469181B2High density low cost wideband production RF test instrument architectureINTEL CORP·Filed 2018·Granted Nov 5, 2019·2 cites·20 claims
- 0966US6968130B1System and method for fully utilizing available optical transmission spectrum in optical networksNOKIA CORP·Filed 1999·Granted Nov 22, 2005·30 cites·33 claims
- 1056US2019293707A1Stacked instrument architecture for testing and validation of electronic circuitsINTEL CORP·Filed 2017·Application pending·0 cites
- 1154US2018188288A1Stacked instrument architecture for testing and validation of electronic circuitsINTEL CORP·Filed 2016·Application pending·0 cites
- 1247US6577147B2Method and apparatus for resisting probe burn using shape memory alloy probe during testing of an electronic deviceINTEL CORP·Filed 2001·Granted Jun 10, 2003·5 cites·24 claims
- 1343US10101367B2Microelectronic test device including a probe card having an interposerINTEL CORP·Filed 2015·Granted Oct 16, 2018·0 cites·24 claims
- 1442US2015243881A1Magnetic shielded integrated circuit packageSANKMAN ROBERT L·Filed 2013·Application pending·0 cites
- 1540US9506980B2Integrated circuit testing architectureDETOFSKY ABRAM M·Filed 2013·Granted Nov 29, 2016·0 cites·22 claims
- 1636US2002141009A1Performance monitoring for multi-port optical devices and systemsFiled 2001·Application pending·0 cites
- 1735US2002071628A1Planar waveguide optical switching system with integrated multi-state outputsFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →