Inventor · disambiguated record
Jiangen Pan
Also filed as: PAN JIANGEN
6 granted patents·4 pending applications·0 citations·filing 2009–2025
62Inventor score
Files withEVERFINE PHOTO E INFO CO LTD3HANGZHOU EVERFINE PHOTO E INFO3EVERFINE PHOTO E INFORMATION CO LTD2HANGZHOU EVERFINE PHO E INFO CO LTD1PAN JIANGEN1
Top patents by PatentIndex Score
10 records- 0161US2025354861A1Method and system for measuring spatial light field of luminaireHANGZHOU EVERFINE PHO E INFO CO LTD·Filed 2025·Application pending·0 cites
- 0251US2025003799A1Optical Radiation Measurement Method and DeviceHANGZHOU EVERFINE PHOTO E INFO·Filed 2024·Application pending·0 cites
- 0350US2024310626A1Measurement method and device of near-eye displayHANGZHOU EVERFINE PHOTO E INFO·Filed 2024·Application pending·0 cites
- 0444US10094792B2Method for analysis of thermal resistanceEVERFINE PHOTO E INFO CO LTD·Filed 2013·Granted Oct 9, 2018·0 cites·8 claims
- 0540US8345352B2Polarization-maintaining reflector arrangementEVERFINE PHOTO E INFO CO LTD·Filed 2009·Granted Jan 1, 2013·0 cites·12 claims
- 0637US10215629B2Handheld optical radiation meter and correction method thereofEVERFINE PHOTO E INFO CO LTD·Filed 2013·Granted Feb 26, 2019·0 cites·9 claims
- 0733US10393655B2Apparatus for retro-reflection measurement using a holed mirror and circular aperture for annular band detectionEVERFINE PHOTO E INFORMATION CO LTD·Filed 2015·Granted Aug 27, 2019·0 cites·15 claims
- 0832US10495511B2Optical radiation measurement method based on light filter units and apparatus thereofEVERFINE PHOTO E INFORMATION CO LTD·Filed 2015·Granted Dec 3, 2019·0 cites·18 claims
- 0931US12498265B2Integrating sphere photometer spectral response measurement method and systemHANGZHOU EVERFINE PHOTO E INFO·Filed 2020·Granted Dec 16, 2025·0 cites·11 claims
- 1030US2014111802A1Low stray light polychromatorPAN JIANGEN·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →