Inventor · disambiguated record
Jin-Ho So
Also filed as: SO JIN-HO
12 granted patents·2 pending applications·84 citations·filing 1996–2025
89Inventor score
Files withSAMSUNG ELECTRONICS CO LTD12RESEARCH & BUSINESS FOUND SUNGKYUNKWAN UNIV1SAMSUNG SDI CO LTD1
Top patents by PatentIndex Score
14 records- 0179US12233560B2Automated gas supply systemSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 25, 2025·0 cites·20 claims
- 0278US6944737B2Memory modules and methods having a buffer clock that operates at different clock frequencies according to the operating modeSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Sep 13, 2005·27 cites·11 claims
- 0374US6252805B1Semiconductor memory device including programmable output pin determining unit and method of reading the same during test modeSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jun 26, 2001·22 cites·10 claims
- 0473US7990168B2Probe card including a sub-plate with a main supporter and a sub-supporter with the sub-supporter having probe needlesSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Aug 2, 2011·3 cites·11 claims
- 0572US9059472B2Winder for electrode assembly of rechargeable batterySAMSUNG SDI CO LTD·Filed 2013·Granted Jun 16, 2015·2 cites·9 claims
- 0671US10495528B2Capacitive torque sensor without limit in flexure hingeRESEARCH & BUSINESS FOUND SUNGKYUNKWAN UNIV·Filed 2018·Granted Dec 3, 2019·2 cites·19 claims
- 0770US11904480B2Automated gas supply systemSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 20, 2024·0 cites·10 claims
- 0869US2025144803A1Automated gas supply systemSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0956US7751265B2Semiconductor device including a plurality of memory units and method of testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jul 6, 2010·3 cites·10 claims
- 1055US7324399B2Refresh control circuit and method for performing a repetition refresh operation and semiconductor memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 29, 2008·3 cites·23 claims
- 1150US2008180120A1Probe cardSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1249US6754112B2Integrated circuit devices having delay circuits for controlling setup/delay times of data signals that are provided to memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 22, 2004·6 cites·13 claims
- 1346US6883061B2Electronic system and refresh methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Apr 19, 2005·8 cites·12 claims
- 1439US5856982AHigh-speed disturb testing method and word line decoder in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jan 5, 1999·8 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →