Inventor · disambiguated record
Jinshu Son
Also filed as: SON JINSHU
19 granted patents·2 pending applications·165 citations·filing 1991–2009
94Inventor score
Top patents by PatentIndex Score
21 records- 0186US7848151B2Circuit to control voltage ramp rateATMEL CORP·Filed 2009·Granted Dec 7, 2010·15 cites·18 claims
- 0286US7512008B2Circuit to control voltage ramp rateATMEL CORP·Filed 2005·Granted Mar 31, 2009·16 cites·12 claims
- 0386US7099202B1Y-mux splitting schemeATMEL CORP·Filed 2005·Granted Aug 29, 2006·20 cites·7 claims
- 0480US7180795B1Method of sensing an EEPROM reference cellATMEL CORP·Filed 2005·Granted Feb 20, 2007·12 cites·30 claims
- 0577US7369446B2Method and apparatus to prevent high voltage supply degradation for high-voltage latches of a non-volatile memoryATMEL CORP·Filed 2006·Granted May 6, 2008·9 cites·21 claims
- 0677US6038185AMethod and apparatus for a serial access memoryATMEL CORP·Filed 1998·Granted Mar 14, 2000·35 cites·15 claims
- 0773US7519486B2Method and apparatus to test the power-on-reset trip point of an integrated circuitATMEL CORP·Filed 2006·Granted Apr 14, 2009·7 cites·33 claims
- 0870US7751256B2Method and apparatus to prevent high voltage supply degradation for high-voltage latches of a non-volatile memoryATMEL CORP·Filed 2007·Granted Jul 6, 2010·6 cites·18 claims
- 0966US7307898B2Method and apparatus for implementing walkout of device junctionsATMEL CORP·Filed 2005·Granted Dec 11, 2007·6 cites·8 claims
- 1065US7336540B2Indirect measurement of negative margin voltages in endurance testing of EEPROM cellsATMEL CORP·Filed 2006·Granted Feb 26, 2008·5 cites·23 claims
- 1160US6097657AMethod for reading out the contents of a serial memoryATMEL CORP·Filed 1999·Granted Aug 1, 2000·16 cites·24 claims
- 1255US7692483B2Apparatus and method for preventing snap back in integrated circuitsATMEL CORP·Filed 2007·Granted Apr 6, 2010·3 cites·8 claims
- 1355US2010064083A1Communications device without passive pullup componentsATMEL CORP·Filed 2009·Application pending·0 cites
- 1449US2007250652A1High speed dual-wire communications device requiring no passive pullup componentsATMEL CORP·Filed 2006·Application pending·0 cites
- 1547US7751248B2Indirect measurement of negative margin voltages in endurance testing of EEPROM cellsATMEL CORP·Filed 2008·Granted Jul 6, 2010·1 cites·25 claims
- 1647US6815992B1Circuit for testing and fine tuning integrated circuit (switch control circuit)ATMEL CORP·Filed 2003·Granted Nov 9, 2004·5 cites·7 claims
- 1746US5204838AHigh speed readout circuitFUJI XEROX CO LTD·Filed 1991·Granted Apr 20, 1993·8 cites·5 claims
- 1838US7868660B2Serial communications bus with active pullupATMEL CORP·Filed 2006·Granted Jan 11, 2011·0 cites·36 claims
- 1934US6856557B2Signal integrity checking circuitATMEL CORP·Filed 2003·Granted Feb 15, 2005·1 cites·9 claims
- 2033US7257046B2Memory data access schemeATMEL CORP·Filed 2005·Granted Aug 14, 2007·0 cites·10 claims
- 2132US7102950B2Fuse data storage system using core memoryATMEL CORP·Filed 2004·Granted Sep 5, 2006·0 cites·36 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →