Inventor · disambiguated record
Jiunn-Chin Tseng
Also filed as: TSENG JIUNN-CHIN
2 granted patents·16 citations·filing 1998–1998
58Inventor score
Files withVANGUARD INT SEMICONDUCT CORP2
Top patents by PatentIndex Score
2 records- 0140US5949726ABias scheme to reduce burn-in test time for semiconductor memory while preventing junction breakdownVANGUARD INT SEMICONDUCT CORP·Filed 1998·Granted Sep 7, 1999·9 cites·17 claims
- 0239US6166582AMethod and apparatus of an output buffer for controlling the ground bounce of a semiconductor deviceVANGUARD INT SEMICONDUCT CORP·Filed 1998·Granted Dec 26, 2000·7 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →