Inventor · disambiguated record

Jing-Sen Wang

Also filed as: WANG JING-SEN

3 granted patents·5 citations·filing 2017–2019

58Inventor score

Technology areasH10P

Files withTAIWAN SEMICONDUCTOR MFG CO LTD3

Top patents by PatentIndex Score

3 records

0182US10510623B2Overlay error and process window metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 17, 2019·3 cites·20 claims
0269US10605855B2Method, test line and system for detecting semiconductor wafer defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Mar 31, 2020·2 cites·20 claims
0358US10879135B2Overlay error and process window metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 29, 2020·0 cites·20 claims

Join the waitlist — get patent alerts

Get an alert when Jing-Sen Wang files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →