Inventor · disambiguated record
Jiaqi Yang
Also filed as: YANG JIAQI
18 granted patents·1 pending application·99 citations·filing 2010–2023
92Inventor score
Files withSCHLUMBERGER TECHNOLOGY CORP9SEMICONDUCTOR MFG INT SHANGHAI CORP7LIU XIAOYAN1UNIV WUHAN1VALERO HENRI-PIERRE1
Top patents by PatentIndex Score
19 records- 0196US9829597B2Model based inversion of acoustic impedance of annulus behind casingSCHLUMBERGER TECHNOLOGY CORP·Filed 2015·Granted Nov 28, 2017·16 cites·15 claims
- 0295US9784875B2Method to estimate cement acoustic wave speeds from data acquired by a cased hole ultrasonic cement evaluation toolSCHLUMBERGER TECHNOLOGY CORP·Filed 2015·Granted Oct 10, 2017·10 cites·20 claims
- 0394US10138727B2Acoustic multi-modality inversion for cement integrity analysisSCHLUMBERGER TECHNOLOGY CORP·Filed 2014·Granted Nov 27, 2018·20 cites·24 claims
- 0494US9534487B2Cement acoustic properties from ultrasonic signal amplitude dispersions in cased wellsSCHLUMBERGER TECHNOLOGY CORP·Filed 2014·Granted Jan 3, 2017·19 cites·33 claims
- 0592US10012749B2Fast model based inversion of acoustic impedance of annulus behind casingSCHLUMBERGER TECHNOLOGY CORP·Filed 2015·Granted Jul 3, 2018·9 cites·20 claims
- 0687US9418763B2Memory array, memory device, and methods for reading and operating the sameSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2015·Granted Aug 16, 2016·9 cites·20 claims
- 0785US9732607B2Methods and apparatus for evaluating properties of cement utilizing ultrasonic signal testingSCHLUMBERGER TECHNOLOGY CORP·Filed 2014·Granted Aug 15, 2017·6 cites·30 claims
- 0883US8552754B2Method of testing reliability of semiconductor deviceLIU XIAOYAN·Filed 2011·Granted Oct 8, 2013·6 cites·17 claims
- 0976US9991002B2Methods for reading and operating memory device including efuseSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2017·Granted Jun 5, 2018·3 cites·19 claims
- 1073US10418287B2Method and structure for improving dielectric reliability of CMOS deviceSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2018·Granted Sep 17, 2019·1 cites·20 claims
- 1160US10672669B2Structure for improving dielectric reliability of CMOS deviceSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2019·Granted Jun 2, 2020·0 cites·13 claims
- 1252US11783569B2Method for classifying hyperspectral images on basis of adaptive multi-scale feature extraction modelUNIV WUHAN·Filed 2023·Granted Oct 10, 2023·0 cites·9 claims
- 1351US10393905B2Torsional wave loggingSCHLUMBERGER TECHNOLOGY CORP·Filed 2016·Granted Aug 27, 2019·0 cites·8 claims
- 1449US9448321B2Torsional wave loggingSCHLUMBERGER TECHNOLOGY CORP·Filed 2013·Granted Sep 20, 2016·0 cites·18 claims
- 1546US9991003B2Methods for reading and operating memory device including efuseSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2017·Granted Jun 5, 2018·0 cites·18 claims
- 1645US10566243B2Semiconductor device having multiple work functions and manufacturing method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2018·Granted Feb 18, 2020·0 cites·20 claims
- 1745US9659672B2Memory device includes efuse, and methods for reading and operating the sameSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2015·Granted May 23, 2017·0 cites·7 claims
- 1844US9217807B2Systems and methods for identifying sanding in production wells using time-lapse sonic dataSCHLUMBERGER TECHNOLOGY CORP·Filed 2013·Granted Dec 22, 2015·0 cites·20 claims
- 1938US2012201096A1Methods and Apparatus to Process Time Series Data for Propagating Signals in A Subterranean FormationVALERO HENRI-PIERRE·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Jiaqi Yang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →