Inventor · disambiguated record
Jiwon Yeom
Also filed as: YEOM JIWON
2 granted patents·2 pending applications·0 citations·filing 2022–2025
27Inventor score
Top patents by PatentIndex Score
4 records- 0175US2024385220A1Test apparatus and test method thereofRYU SUNGYOON·Filed 2024·Application pending·0 cites
- 0275US2025341540A1Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0369US12385946B2Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 12, 2025·0 cites·8 claims
- 0468US12092656B2Test apparatus and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 17, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →