Inventor · disambiguated record
Jiachun Zhou
Also filed as: ZHOU JIACHUN
6 granted patents·9 pending applications·40 citations·filing 2004–2024
79Inventor score
Files withSMITHS INTERCONNECT AMERICAS INC7ANTARES ADVANCED TEST TECH SUZHOU LIMITED3ZHOU JIACHUN2ANTARES ADVANCED TEST TECHNOLO1HENRY DAVID1
Top patents by PatentIndex Score
15 records- 0180US8758066B2Electrical connector with insulation memberZHOU JIACHUN·Filed 2012·Granted Jun 24, 2014·17 cites·43 claims
- 0278US8506307B2Electrical connector with embedded shell layerHENRY DAVID·Filed 2010·Granted Aug 13, 2013·16 cites·19 claims
- 0376US11283206B2Impedance controlled metallized plastic socketSMITHS INTERCONNECT AMERICAS INC·Filed 2019·Granted Mar 22, 2022·3 cites·17 claims
- 0472US11221348B2Impedance controlled test socketSMITHS INTERCONNECT AMERICAS INC·Filed 2018·Granted Jan 11, 2022·2 cites·19 claims
- 0569US2025138085A1Liquid cooled test system for testing semiconductor integrated circuit chipsANTARES ADVANCED TEST TECH SUZHOU LIMITED·Filed 2024·Application pending·0 cites
- 0665US2024142513A1Liquid cooled test system for testing semiconductor integrated circuit chipsANTARES ADVANCED TEST TECH SUZHOU LIMITED·Filed 2024·Application pending·0 cites
- 0757US8808010B2Insulated metal socketZHOU JIACHUN·Filed 2012·Granted Aug 19, 2014·2 cites·32 claims
- 0856US2023099805A1Liquid cooled test system for testing semiconductor integrated circuit chipsANTARES ADVANCED TEST TECH SUZHOU LIMITED·Filed 2022·Application pending·0 cites
- 0950US2024377433A1Test socket and probe with stepped collar for semiconductor integrated circuitsSMITHS INTERCONNECT AMERICAS INC·Filed 2022·Application pending·0 cites
- 1044US2024402217A1Systems and methods for coaxial test socket and printed circuit board interfacesSMITHS INTERCONNECT AMERICAS INC·Filed 2022·Application pending·0 cites
- 1142US2024329080A1Systems and methods for coaxial test socket and printed circuit board interfacesSMITHS INTERCONNECT AMERICAS INC·Filed 2022·Application pending·0 cites
- 1239US12210036B2Test socket for semiconductor integrated circuitsSMITHS INTERCONNECT AMERICAS INC·Filed 2021·Granted Jan 28, 2025·0 cites·18 claims
- 1338US2024393364A1Systems and methods for test sockets having scrubbing contactsSMITHS INTERCONNECT AMERICAS INC·Filed 2022·Application pending·0 cites
- 1435US2005174136A1Test pin back surface in probe apparatus for low wear multiple contacting with conductive elastomerFiled 2004·Application pending·0 cites
- 1527US2009261851A1Spring probeANTARES ADVANCED TEST TECHNOLO·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →