Inventor · disambiguated record
John M. Aitken
Also filed as: AITKEN JOHN M · AITKEN JOHN MILFORD
23 granted patents·3 pending applications·421 citations·filing 1992–2020
96Inventor score
Top patents by PatentIndex Score
26 records- 0194US5363550AMethod of Fabricating a micro-coaxial wiring structureIBM·Filed 1992·Granted Nov 15, 1994·112 cites·7 claims
- 0290US7381981B2Phase-change TaN resistor based triple-state/multi-state read only memoryIBM·Filed 2005·Granted Jun 3, 2008·18 cites·20 claims
- 0388US5268324AModified silicon CMOS process having selectively deposited Si/SiGe FETSIBM·Filed 1992·Granted Dec 7, 1993·79 cites·8 claims
- 0486US5444015ALarce scale IC personalization method employing air dielectric structure for extended conductorsIBM·Filed 1994·Granted Aug 22, 1995·77 cites·5 claims
- 0583US7315075B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2005·Granted Jan 1, 2008·8 cites·12 claims
- 0675US7935609B2Method for fabricating semiconductor device having radiation hardened insulatorsIBM·Filed 2008·Granted May 3, 2011·4 cites·20 claims
- 0774US6352902B1Process of forming a capacitor on a substrateIBM·Filed 2000·Granted Mar 5, 2002·14 cites·8 claims
- 0873US7388274B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2007·Granted Jun 17, 2008·4 cites·13 claims
- 0970US7943482B2Method for semiconductor device having radiation hardened insulators and design structure thereofIBM·Filed 2008·Granted May 17, 2011·4 cites·10 claims
- 1065US7084483B2Trench type buried on-chip precision programmable resistorIBM·Filed 2004·Granted Aug 1, 2006·10 cites·16 claims
- 1163US7601602B2Trench type buried on-chip precision programmable resistorIBM·Filed 2006·Granted Oct 13, 2009·2 cites·2 claims
- 1262US11485992B2Screening and culture methodOTAKARO PATHWAYS LTD·Filed 2016·Granted Nov 1, 2022·1 cites·23 claims
- 1362US7715248B2Phase-change TaN resistor based triple-state/multi-state read only memoryIBM·Filed 2008·Granted May 11, 2010·3 cites·20 claims
- 1462US7064414B2Heater for annealing trapped charge in a semiconductor deviceIBM·Filed 2004·Granted Jun 20, 2006·10 cites·29 claims
- 1561US6252275B1Silicon-on-insulator non-volatile random access memory deviceIBM·Filed 1999·Granted Jun 26, 2001·20 cites·25 claims
- 1658US5530290ALarge scale IC personalization method employing air dielectric structure for extended conductorIBM·Filed 1994·Granted Jun 25, 1996·22 cites·13 claims
- 1757US6088258AStructures for reduced topography capacitorsIBM·Filed 1998·Granted Jul 11, 2000·14 cites·12 claims
- 1856US7880158B2Phase-change TaN resistor based triple-state/multi-state read only memoryIBM·Filed 2008·Granted Feb 1, 2011·2 cites·10 claims
- 1955US2011068423A1Photodetector with wavelength discrimination, and method for forming the same and design structureIBM·Filed 2009·Application pending·0 cites
- 2053US6159787AStructures and processes for reduced topography trench capacitorsIBM·Filed 1998·Granted Dec 12, 2000·15 cites·11 claims
- 2152US7791169B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2008·Granted Sep 7, 2010·0 cites·15 claims
- 2251US2022127657A1A method for detecting dormant or cell wall deficient mycobacterium species and a method and medium for the growth promotion of dormant or cell wall deficient forms of mycobacterium speciesAITKEN JOHN MILFORD·Filed 2020·Application pending·0 cites
- 2347US8035200B2Neutralization of trapped charge in a charge accumulation layer of a semiconductor structureIBM·Filed 2010·Granted Oct 11, 2011·0 cites·16 claims
- 2447US7736915B2Method for neutralizing trapped charge in a charge accumulation layer of a semiconductor structureIBM·Filed 2006·Granted Jun 15, 2010·0 cites·8 claims
- 2546US6333239B1Processes for reduced topography capacitorsIBM·Filed 2000·Granted Dec 25, 2001·2 cites·24 claims
- 2633US2002027681A1Gate stack process for high reliability dual oxide CMOS devices and circuitsIBM·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →