Inventor · disambiguated record
Jon C. Baker
Also filed as: BAKER JON · BAKER JON C
1 granted patent·1 pending application·3 citations·filing 2001–2007
20Inventor score
Files withFREESCALE SEMICONDUCTOR INC1
Top patents by PatentIndex Score
2 records- 0145US7676769B2Adaptive threshold wafer testing device and method thereofFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Mar 9, 2010·3 cites·19 claims
- 0235US2003120624A1System and method for efficiently installing and configuring device drivers in managed environmentsFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →