Inventor · disambiguated record
Johannes G. Beha
Also filed as: BEHA JOHANNES G
12 granted patents·421 citations·filing 1982–1989
93Inventor score
Files withIBM12
Top patents by PatentIndex Score
12 records- 0187US4706018ANoncontact dynamic tester for integrated circuitsIBM·Filed 1984·Granted Nov 10, 1987·47 cites·11 claims
- 0286US4999577AMethod for contactless testing of conducting paths in a substrate using photon-assisted tunnelingIBM·Filed 1989·Granted Mar 12, 1991·44 cites·10 claims
- 0386US4868492AMethod for contactless testing of conducting paths in a substrate using photo-assisted tunnelingIBM·Filed 1987·Granted Sep 19, 1989·48 cites·9 claims
- 0485US4843329AMethod for contactless testing for electrical opens and short circuits in conducting paths in a substrateIBM·Filed 1987·Granted Jun 27, 1989·50 cites·18 claims
- 0584US5008878AHigh-speed modular switching apparatus for circuit and packet switched trafficIBM·Filed 1988·Granted Apr 16, 1991·86 cites·8 claims
- 0680US4703260AFull chip integrated circuit testerIBM·Filed 1985·Granted Oct 27, 1987·37 cites·11 claims
- 0770US4845425AFull chip integrated circuit testerIBM·Filed 1987·Granted Jul 4, 1989·25 cites·4 claims
- 0866US4918309AMethod for investigating surfaces at nanometer and picosecond resolution and laser-sampled scanning tunneling microscope for performing said methodIBM·Filed 1988·Granted Apr 17, 1990·24 cites·14 claims
- 0960US4786864APhoton assisted tunneling testing of passivated integrated circuitsIBM·Filed 1986·Granted Nov 22, 1988·26 cites·5 claims
- 1052US4644264APhoton assisted tunneling testing of passivated integrated circuitsIBM·Filed 1985·Granted Feb 17, 1987·20 cites·1 claims
- 1146US4670710ANoncontact full-line dynamic AC tester for integrated circuitsIBM·Filed 1985·Granted Jun 2, 1987·10 cites·3 claims
- 1235US4525730ABuried junction Josephson interferometerIBM·Filed 1982·Granted Jun 25, 1985·4 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Johannes G. Beha files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →