Inventor · disambiguated record
John Breuer
Also filed as: BREUER JOHN
16 granted patents·4 pending applications·42 citations·filing 2015–2023
88Inventor score
Files withICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH16ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH2ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPUEFTECHNIK MBH1INTEGRATED CIRCUIT TESTING1
Top patents by PatentIndex Score
20 records- 0192US10176965B1Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamletsICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2017·Granted Jan 8, 2019·22 cites·20 claims
- 0287US11817292B2Primary charged particle beam current measurementICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2020·Granted Nov 14, 2023·4 cites·15 claims
- 0386US9697983B1Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2016·Granted Jul 4, 2017·7 cites·20 claims
- 0486US9472373B1Beam separator device, charged particle beam device and methods of operating thereofICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2015·Granted Oct 18, 2016·7 cites·20 claims
- 0582US11545338B2Charged particle beam apparatus and method of controlling sample chargeICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Jan 3, 2023·1 cites·16 claims
- 0669US12412727B2Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereofICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2022·Granted Sep 9, 2025·0 cites·22 claims
- 0764US2025140511A1Method of characterizing a detection path of a charged particle beam and a charged particle mirrorICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2023·Application pending·0 cites
- 0863US12451322B2Method of forming a multipole device, method of influencing an electron beam, and multipole deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2023·Granted Oct 21, 2025·0 cites·13 claims
- 0963US12386164B2Method of determining a brightness of a charged particle beam, method of determining a size of a source of the charged particle beam, and charged particle beam imaging deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2022·Granted Aug 12, 2025·0 cites·20 claims
- 1063US9349566B1Charged particle beam device, beam deflector device and methods of operating thereofINTEGRATED CIRCUIT TESTING·Filed 2015·Granted May 24, 2016·1 cites·20 claims
- 1160US11791128B2Method of determining the beam convergence of a focused charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Oct 17, 2023·0 cites·20 claims
- 1257US10784072B2Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamletsICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2018·Granted Sep 22, 2020·0 cites·17 claims
- 1357US2025037965A1Method of determining a beam convergence of a charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2023·Application pending·0 cites
- 1456US11810753B2Methods of determining aberrations of a charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Nov 7, 2023·0 cites·21 claims
- 1555US2024222063A1Charged particle beam column, charged particle beam chromatic aberration corrector, and method of correcting charged particle beam chromatic aberrationICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPUEFTECHNIK MBH·Filed 2022·Application pending·0 cites
- 1654US2024355576A1Aberration corrector, a charged particle beam apparatus, a method of aligning an aberration corrector and a method of correcting aberration of a charged particle beamICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2023·Application pending·0 cites
- 1751US12308203B2Methods of determining aberrations of a charged particle beam, and charged particle beam systemICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2022·Granted May 20, 2025·0 cites·21 claims
- 1851US11501947B1Aberration corrector and method of aligning aberration correctorICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Nov 15, 2022·0 cites·20 claims
- 1951US11257657B2Charged particle beam device with interferometer for height measurementICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2020·Granted Feb 22, 2022·0 cites·20 claims
- 2049US10991544B2Charged particle beam device, objective lens module, electrode device, and method of inspecting a specimenICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2019·Granted Apr 27, 2021·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →