Inventor · disambiguated record
John B. Burnett
Also filed as: BURNETT JOHN · BURNETT JOHN B
9 granted patents·195 citations·filing 1978–2015
88Inventor score
Files withELECTRO SCIENT IND INC2TERADYNE INC2FREIFELD DANIEL1LANDREX TECHNOLOGIES CO LTD1LOCK LIGHT CORP1
Top patents by PatentIndex Score
9 records- 0193US7619646B2System and method to illuminate and image the inside diameter of a stentVISICON INSPECTION TECHNOLOGIE·Filed 2007·Granted Nov 17, 2009·35 cites·7 claims
- 0292US4276582AKey with lightLOCK LIGHT CORP·Filed 1978·Granted Jun 30, 1981·82 cites·18 claims
- 0383US6850637B1Lighting arrangement for automated optical inspection systemTERADYNE INC·Filed 2000·Granted Feb 1, 2005·26 cites·16 claims
- 0482US6621566B1Optical inspection system having integrated component learningTERADYNE INC·Filed 2000·Granted Sep 16, 2003·34 cites·20 claims
- 0563US6884988B2Automated optical inspection system with light trapLANDREX TECHNOLOGIES CO LTD·Filed 2001·Granted Apr 26, 2005·5 cites·17 claims
- 0658US9261465B2System and method to illuminate and image the inside diameter of a stentFREIFELD DANIEL·Filed 2009·Granted Feb 16, 2016·0 cites·11 claims
- 0757US9939624B2Five axis optical inspection systemELECTRO SCIENT IND INC·Filed 2015·Granted Apr 10, 2018·1 cites·11 claims
- 0848US9823101B2Automated stent inspection systemELECTRO SCIENT IND INC·Filed 2013·Granted Nov 21, 2017·0 cites·21 claims
- 0945US4967147ACircuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assembliesZEHNTEL INC·Filed 1988·Granted Oct 30, 1990·12 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →