Inventor · disambiguated record
Jonathan Chang
Also filed as: CHANG JONATHAN · CHANG JONATHAN CHEANG-WHANG
6 granted patents·114 citations·filing 2000–2019
82Inventor score
Top patents by PatentIndex Score
6 records- 0196US7635843B1In-line reliability test using E-beam scanXILINX INC·Filed 2007·Granted Dec 22, 2009·85 cites·20 claims
- 0288US11197417B2Grain quality control system and methodDEERE & CO·Filed 2019·Granted Dec 14, 2021·6 cites·20 claims
- 0385US10629512B2Integrated circuit die with in-chip heat sinkXILINX INC·Filed 2018·Granted Apr 21, 2020·4 cites·20 claims
- 0472US11818982B2Grain quality control system and methodDEERE & CO·Filed 2019·Granted Nov 21, 2023·3 cites·14 claims
- 0565US7091077B1Method of directionally trimming polysilicon widthXILINX INC·Filed 2005·Granted Aug 15, 2006·3 cites·16 claims
- 0662US6580072B1Method for performing failure analysis on copper metallizationXILINX INC·Filed 2000·Granted Jun 17, 2003·13 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →