Inventor · disambiguated record
John Changala
Also filed as: CHANGALA JOHN · CHANGALA JOHN PAUL
16 granted patents·7 pending applications·146 citations·filing 2015–2025
94Inventor score
Top patents by PatentIndex Score
23 records- 0198US12241924B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2022·Granted Mar 4, 2025·3 cites·19 claims
- 0298US11821911B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2021·Granted Nov 21, 2023·6 cites·6 claims
- 0398US11473903B2Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopyBOEING CO·Filed 2021·Granted Oct 18, 2022·7 cites·20 claims
- 0498US11293965B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2020·Granted Apr 5, 2022·12 cites·14 claims
- 0598US11150287B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2020·Granted Oct 19, 2021·9 cites·16 claims
- 0698US10663504B2Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2017·Granted May 26, 2020·14 cites·23 claims
- 0797US11988611B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2021·Granted May 21, 2024·4 cites·18 claims
- 0897US10613131B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2018·Granted Apr 7, 2020·15 cites·22 claims
- 0997US10591525B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2017·Granted Mar 17, 2020·15 cites·32 claims
- 1097US10274310B2Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopyBOEING CO·Filed 2016·Granted Apr 30, 2019·19 cites·13 claims
- 1196US11415617B2Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2019·Granted Aug 16, 2022·9 cites·12 claims
- 1296US11199507B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2019·Granted Dec 14, 2021·11 cites·9 claims
- 1396US10551325B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2015·Granted Feb 4, 2020·19 cites·8 claims
- 1488US12510350B2Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopyBOEING CO·Filed 2023·Granted Dec 30, 2025·0 cites·20 claims
- 1586US10928188B2Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopyBOEING CO·Filed 2019·Granted Feb 23, 2021·3 cites·23 claims
- 1682US2025093277A1Systems for parsing material properties from within shg signalsFEMTOMETRIX INC·Filed 2024·Application pending·0 cites
- 1779US11808563B2Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopyBOEING CO·Filed 2022·Granted Nov 7, 2023·0 cites·20 claims
- 1879US2025155486A1Wafer metrology technologiesFEMTOMETRIX INC·Filed 2025·Application pending·0 cites
- 1966US2018292441A1Charge decay measurement systems and methodsFEMTOMETRIX INC·Filed 2018·Application pending·0 cites
- 2060US2015331036A1Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 2160US2015330908A1Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 2260US2015330909A1Wafer metrology techonologiesFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 2360US2015331029A1Charge decay measurement systems and methodsFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →