Inventor · disambiguated record
John Connor
Also filed as: CONNOR JOHN · CONNOR JOHN P · FLAKER ROY CHILDS
23 granted patents·803 citations·filing 1991–2003
97Inventor score
Top patents by PatentIndex Score
23 records- 0195US5535164ABIST tester for multiple memoriesIBM·Filed 1995·Granted Jul 9, 1996·149 cites·18 claims
- 0293US5553082ABuilt-in self-test for logic circuitry at memory array outputIBM·Filed 1995·Granted Sep 3, 1996·115 cites·22 claims
- 0392US5796745AMemory array built-in self test circuit for testing multi-port memory arraysIBM·Filed 1996·Granted Aug 18, 1998·105 cites·20 claims
- 0484US5740098AUsing one memory to supply addresses to an associated memory during testingIBM·Filed 1996·Granted Apr 14, 1998·47 cites·5 claims
- 0582US5784323ATest converage of embedded memories on semiconductor substratesIBM·Filed 1997·Granted Jul 21, 1998·50 cites·17 claims
- 0680US6965503B2Electro-static discharge protection circuitIBM·Filed 2003·Granted Nov 15, 2005·27 cites·19 claims
- 0775US5057039AElectrical or communications monument for mounting along an edge of a work surfaceWESTINGHOUSE ELECTRIC CORP·Filed 1991·Granted Oct 15, 1991·50 cites·6 claims
- 0871US5793592ADynamic dielectric protection circuit for a receiverIBM·Filed 1997·Granted Aug 11, 1998·25 cites·15 claims
- 0969US5790564AMemory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method thereforIBM·Filed 1995·Granted Aug 4, 1998·25 cites·3 claims
- 1069US5563833AUsing one memory to supply addresses to an associated memory during testingIBM·Filed 1995·Granted Oct 8, 1996·23 cites·17 claims
- 1166US6278339B2Termination resistance independent system for impedance matching in high speed input-output chip interfacingIBM·Filed 2000·Granted Aug 21, 2001·9 cites·18 claims
- 1264US5929667AMethod and apparatus for protecting circuits subjected to high voltageIBM·Filed 1997·Granted Jul 27, 1999·19 cites·15 claims
- 1353US5088541ASpace dividing panel system with counter capWESTINGHOUSE ELECTRIC CORP·Filed 1991·Granted Feb 18, 1992·26 cites·7 claims
- 1452US5771242AMemory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method thereforIBM·Filed 1996·Granted Jun 23, 1998·12 cites·12 claims
- 1551US6501293B2Method and apparatus for programmable active termination of input/output devicesIBM·Filed 1999·Granted Dec 31, 2002·27 cites·2 claims
- 1649US6617986B2Area efficient, sequential gray code to thermometer code decoderIBM·Filed 2001·Granted Sep 9, 2003·7 cites·18 claims
- 1749US6140885AOn-chip automatic system for impedance matching in very high speed input-output chip interfacingIBM·Filed 1999·Granted Oct 31, 2000·24 cites·15 claims
- 1849US5815354AReceiver input voltage protection circuitIBM·Filed 1997·Granted Sep 29, 1998·16 cites·16 claims
- 1949US5761213AMethod and apparatus to determine erroneous value in memory cells using data compressionIBM·Filed 1996·Granted Jun 2, 1998·11 cites·17 claims
- 2049US5539753AMethod and apparatus for output deselecting of data during testIBM·Filed 1995·Granted Jul 23, 1996·15 cites·17 claims
- 2146US5745498ARapid compare of two binary numbersIBM·Filed 1996·Granted Apr 28, 1998·8 cites·25 claims
- 2237US6353903B1Method and apparatus for testing differential signalsIBM·Filed 1994·Granted Mar 5, 2002·6 cites·11 claims
- 2336US6249193B1Termination impedance independent system for impedance matching in high speed input-output chip interfacingIBM·Filed 1999·Granted Jun 19, 2001·7 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →