Inventor · disambiguated record
John Damiano, Jr.
Also filed as: DAMIANO JOHN · DAMIANO JOHN JOSEPH · DAMIANO JR JOHN
68 granted patents·10 pending applications·435 citations·filing 1975–2025
99Inventor score
Top patents by PatentIndex Score
78 records- 0196US9324539B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesPROTOCHIPS INC·Filed 2014·Granted Apr 26, 2016·14 cites·21 claims
- 0296US8829469B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesDAMIANO JR JOHN·Filed 2011·Granted Sep 9, 2014·24 cites·14 claims
- 0396US7713053B2Reusable template for creation of thin films; method of making and using template; and thin films produced from templatePROTOCHIPS INC·Filed 2005·Granted May 11, 2010·26 cites·36 claims
- 0494US9466459B2Method for optimizing fluid flow across a sample within an electron microscope sample holderPROTOCHIPS INC·Filed 2015·Granted Oct 11, 2016·11 cites·19 claims
- 0594US8872129B2Microscopy support structuresDAMIANO JR JOHN·Filed 2008·Granted Oct 28, 2014·19 cites·24 claims
- 0694US8466432B2Sample holder providing interface to semiconductor device with high density connectionsDAMIANO JR JOHN·Filed 2011·Granted Jun 18, 2013·18 cites·15 claims
- 0793US12130858B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2023·Granted Oct 29, 2024·1 cites·20 claims
- 0893US11902665B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Feb 13, 2024·4 cites·20 claims
- 0992US8513621B2Specimen holder used for mountingNACKASHI DAVID P·Filed 2009·Granted Aug 20, 2013·24 cites·18 claims
- 1089US10986279B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2020·Granted Apr 20, 2021·2 cites·12 claims
- 1188US10373800B2Method for optimizing fluid flow across a sample within an electron microscope sample holderPROTOCHIPS INC·Filed 2018·Granted Aug 6, 2019·3 cites·14 claims
- 1288US9666409B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesPROTOCHIPS INC·Filed 2016·Granted May 30, 2017·3 cites·20 claims
- 1388US9048065B2Methods of using temperature control devices in electron microscopyDAMIANO JOHN·Filed 2010·Granted Jun 2, 2015·10 cites·14 claims
- 1487US9275826B2Microscopy support structuresPROTOCHIPS INC·Filed 2014·Granted Mar 1, 2016·5 cites·22 claims
- 1587US8920723B2Sample support structure and methodsDAMIANO JR JOHN·Filed 2007·Granted Dec 30, 2014·11 cites·20 claims
- 1687US2025338020A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 1786US9312097B2Specimen holder used for mounting samples in electron microscopesPROTOCHIPS INC·Filed 2014·Granted Apr 12, 2016·7 cites·19 claims
- 1886US9275825B2Sample holder for electron microscopy for low-current, low-noise analysisDAMIANO JOHN·Filed 2012·Granted Mar 1, 2016·8 cites·8 claims
- 1985USD841183SWindow E-chip for an electron microscopePROTOCHIPS INC·Filed 2016·Granted Feb 19, 2019·25 cites·1 claims
- 2085US9437393B2Method for forming an electrical connection to an sample support in an electron microscope holderPROTOCHIPS INC·Filed 2013·Granted Sep 6, 2016·11 cites·14 claims
- 2184US12375815B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 2284US12284445B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Apr 22, 2025·0 cites·20 claims
- 2384US9818578B2Device for monitoring environmental states of a microscope sample with an electron microscope sample holderPROTOCHIPS INC·Filed 2015·Granted Nov 14, 2017·3 cites·20 claims
- 2484US9064672B2Specimen mount for microscopyMICK STEPHEN E·Filed 2008·Granted Jun 23, 2015·10 cites·17 claims
- 2584US2025053594A1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessionsPROTOCHIPS INC·Filed 2024·Application pending·0 cites
- 2683US9040939B2Membrane supports with reinforcement featuresDAMIANO JR JOHN·Filed 2008·Granted May 26, 2015·11 cites·17 claims
- 2782US8872128B2Sample holder providing interface to semiconductor device with high density connectionsPROTOCHIPS INC·Filed 2013·Granted Oct 28, 2014·4 cites·16 claims
- 2880US10014154B2Method for enabling modular part replacement within an electron microscope sample holderPROTOCHIPS INC·Filed 2016·Granted Jul 3, 2018·2 cites·20 claims
- 2980US8859991B2Specimen holder used for mounting samples in electron microscopesPROTOCHIPS INC·Filed 2013·Granted Oct 14, 2014·5 cites·19 claims
- 3080US8853646B2Specimen holder used for mounting samples in electron microscopesPROTOCHIPS INC·Filed 2013·Granted Oct 7, 2014·5 cites·19 claims
- 3180US3991116A4-Tert-butyl-N-sec-butyl-2,6-dinitroanilineAMCHEM PROD·Filed 1975·Granted Nov 9, 1976·10 cites·3 claims
- 3280US2025260901A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 3377US12010430B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 3476US11755639B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 12, 2023·0 cites·20 claims
- 3576US10128079B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2016·Granted Nov 13, 2018·1 cites·20 claims
- 3676USD806892STip of a sample holderPROTOCHIPS INC·Filed 2014·Granted Jan 2, 2018·20 cites·1 claims
- 3776US5548132AThin film transistor with large grain size DRW offset region and small grain size source and drain and channel regionsMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 20, 1996·32 cites·6 claims
- 3875US11869744B2Electron microscope sample holder fluid handling with independent pressure and flow controlPROTOCHIPS INC·Filed 2022·Granted Jan 9, 2024·0 cites·12 claims
- 3974US11455333B1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 27, 2022·0 cites·20 claims
- 4074US4753679ACement products containing surface treated inorganic particulatesPFIZER·Filed 1986·Granted Jun 28, 1988·24 cites·11 claims
- 4173US7736415B2Rotary lanceSPECIALTY MINERALS MICHIGAN·Filed 2007·Granted Jun 15, 2010·2 cites·22 claims
- 4272US11477388B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Oct 18, 2022·0 cites·20 claims
- 4372US11170968B2MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2020·Granted Nov 9, 2021·0 cites·14 claims
- 4472US9837746B2Method for forming an electrical connection to a sample support in an electron microscope holderPROTOCHIPS INC·Filed 2016·Granted Dec 5, 2017·2 cites·20 claims
- 4570US8221677B2Wire injection lance nozzle insertCOLAVITO DOMINICK M·Filed 2007·Granted Jul 17, 2012·2 cites·11 claims
- 4669US11514586B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Nov 29, 2022·0 cites·25 claims
- 4769US11399138B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Jul 26, 2022·0 cites·10 claims
- 4869US5284808ADry refractory compositionMINTEQ INTERNATIONAL INC·Filed 1992·Granted Feb 8, 1994·28 cites·15 claims
- 4968US11222765B2Electron microscope sample holder fluid handling with independent pressure and flow controlPROTOCHIPS INC·Filed 2020·Granted Jan 11, 2022·0 cites·19 claims
- 5068US10777380B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2019·Granted Sep 15, 2020·0 cites·20 claims
Showing the top 50 of 78 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →