Inventor · disambiguated record
John P. Deluca
Also filed as: DELUCA JOHN P · MURRELL LAWRENCE L
11 granted patents·524 citations·filing 1975–2012
91Inventor score
Files withEXXON RESEARCH ENGINEERING CO5DELUCA JOHN P2JOHNSON BAYARD K1MEMC ELECTRONIC MATERIALS1SONEX INT CORP1
Top patents by PatentIndex Score
11 records- 0196US5496256AUltrasonic bone healing device for dental applicationSONEX INT CORP·Filed 1994·Granted Mar 5, 1996·294 cites·13 claims
- 0294US4101287ACombined heat exchanger reactorEXXON RESEARCH ENGINEERING CO·Filed 1977·Granted Jul 18, 1978·121 cites·12 claims
- 0387US9051659B2Silicon single crystal doped with gallium, indium, or aluminumDELUCA JOHN P·Filed 2011·Granted Jun 9, 2015·9 cites·23 claims
- 0485US3990998AHigh surface area ruthenium bonding supports on monolithic ceramicsEXXON RESEARCH ENGINEERING CO·Filed 1975·Granted Nov 9, 1976·41 cites·9 claims
- 0578US9105786B2Thermal treatment of silicon wafers useful for photovoltaic applicationsDELUCA JOHN P·Filed 2012·Granted Aug 11, 2015·2 cites·12 claims
- 0672US5910295AClosed loop process for producing polycrystalline silicon and fumed silicaMEMC ELECTRONIC MATERIALS·Filed 1997·Granted Jun 8, 1999·32 cites·5 claims
- 0762US4120936AProcess for conversion of UF6 to UO2EXXON RESEARCH ENGINEERING CO·Filed 1977·Granted Oct 17, 1978·9 cites·29 claims
- 0858US4169883AProcess for preparing ultra-stable, high surface area alpha-aluminaEXXON RESEARCH ENGINEERING CO·Filed 1978·Granted Oct 2, 1979·12 cites·14 claims
- 0945US10202705B2Silicon ingot having uniform multiple dopants and method and apparatus for producing sameJOHNSON BAYARD K·Filed 2012·Granted Feb 12, 2019·0 cites·10 claims
- 1039US4096231ASeparation of uranium hexafluoride from plutonium hexafluoride by means of selective intercalation in graphiteEXXON RESEARCH ENGINEERING CO·Filed 1976·Granted Jun 20, 1978·3 cites·5 claims
- 1136US6895096B1Microchannel plate audio amplifierFiled 2000·Granted May 17, 2005·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →