Inventor · disambiguated record
Jorge L. Devarona
Also filed as: DEVARONA JORGE L
6 granted patents·355 citations·filing 1998–2001
88Inventor score
Technology areasG01R
Files withMICRON TECHNOLOGY INC6
Top patents by PatentIndex Score
6 records- 0194US6366112B1Probe card having on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 2, 2002·62 cites·21 claims
- 0294US6246250B1Probe card having on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 12, 2001·106 cites·19 claims
- 0389US6337577B1Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 8, 2002·65 cites·20 claims
- 0489US6300786B1Wafer test method with probe card having on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 9, 2001·63 cites·16 claims
- 0588US6466047B1System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 15, 2002·30 cites·26 claims
- 0687US6433574B1Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 13, 2002·29 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →