Inventor · disambiguated record
Jorge L. De Varona
Also filed as: DE VARONA JORGE L
6 granted patents·336 citations·filing 1999–2003
88Inventor score
Files withMICRON TECHNOLOGY INC6
Top patents by PatentIndex Score
6 records- 0194US6620633B2Method for testing bumped semiconductor componentsMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 16, 2003·69 cites·28 claims
- 0294US6380555B1Bumped semiconductor component having test pads, and method and system for testing bumped semiconductor componentsMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 30, 2002·130 cites·26 claims
- 0393US6933524B2Semiconductor component having test contactsMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 23, 2005·51 cites·21 claims
- 0490US6954000B2Semiconductor component with redistribution circuit having conductors and test contactsMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 11, 2005·40 cites·6 claims
- 0581US6677776B2Method and system having switching network for testing semiconductor components on a substrateMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 13, 2004·28 cites·55 claims
- 0674US6853211B2Method and system having switching network for testing semiconductor components on a substrateMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 8, 2005·18 cites·45 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →