Inventor · disambiguated record
Johannes De Wilde
Also filed as: DE WILDE JOHANNES
12 granted patents·320 citations·filing 1980–2004
93Inventor score
Top patents by PatentIndex Score
12 records- 0195US7619431B2High sensitivity magnetic built-in current sensorNXP BV·Filed 2004·Granted Nov 17, 2009·115 cites·21 claims
- 0286US4791358AIntegrated circuits, carriers therefor and testing apparatus and method for the foregoingPHILIPS CORP·Filed 1986·Granted Dec 13, 1988·51 cites·4 claims
- 0381US5963038AMethod of testing a connection which includes a conductor in an integrated circuitPHILIPS CORP·Filed 1997·Granted Oct 5, 1999·51 cites·18 claims
- 0470US6664798B2Integrated circuit with test interfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Dec 16, 2003·17 cites·15 claims
- 0565US6812690B2Integrated circuit with power supply test interfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Nov 2, 2004·12 cites·13 claims
- 0661US4568906ASensor having a magnetic field-sensitive element with accurately defined weight and thickness dimensions in the nanometer rangePHILIPS CORP·Filed 1985·Granted Feb 4, 1986·11 cites·14 claims
- 0753US5781559ATestable circuitPHILIPS CORP·Filed 1996·Granted Jul 14, 1998·18 cites·15 claims
- 0852US4435900AMethod of manufacturing a magnetic head unitPHILIPS CORP·Filed 1982·Granted Mar 13, 1984·13 cites·4 claims
- 0950US6297643B2Connection test methodPHILIPS CORP·Filed 1999·Granted Oct 2, 2001·15 cites·11 claims
- 1050US4666554AMethod of manufacturing a sensor having a magnetic field sensitive elementPHILIPS CORP·Filed 1985·Granted May 19, 1987·7 cites·9 claims
- 1144US4429337AMagnetic head unit having thermally dissipating cover platePHILIPS CORP·Filed 1980·Granted Jan 31, 1984·9 cites·18 claims
- 1240US6765403B2Test circuit and test method for protecting an IC against damage from activation of too many current drawing circuits at one timeKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jul 20, 2004·1 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →