Inventor · disambiguated record
Johann Foucher
Also filed as: FOUCHER JOHANN
6 granted patents·2 pending applications·25 citations·filing 2001–2014
78Inventor score
Files withCOMMISSARIAT ENERGIE ATOMIQUE3COMMISSARIAT L ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES3COMMISSARIAT A L ENRGIE ATOMIQ1FOUCHER JOHANN1
Top patents by PatentIndex Score
8 records- 0179US8739310B2Characterization structure for an atomic force microscope tipCOMMISSARIAT L ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES·Filed 2013·Granted May 27, 2014·6 cites·12 claims
- 0277US9646804B2Method for calibration of a CD-SEM characterisation techniqueCOMMISSARIAT L ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES·Filed 2014·Granted May 9, 2017·3 cites·9 claims
- 0367US8443460B2Method and structure for characterising an atomic force microscopy tipFOUCHER JOHANN·Filed 2010·Granted May 14, 2013·5 cites·13 claims
- 0456US8723116B2Method of determining an applicable threshold for determining the critical dimension of at least one category of patterns imaged by atomic force scanning electron microscopyCOMMISSARIAT L ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES·Filed 2013·Granted May 13, 2014·2 cites·11 claims
- 0553US6818488B2Process for making a gate for a short channel CMOS transistor structureCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2001·Granted Nov 16, 2004·9 cites·14 claims
- 0646US10359994B2Computer system for processing heterogeneous measurements from various metrology apparatuses with a view to estimating values of features of microelectronic devices, corresponding method and computer programCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2014·Granted Jul 23, 2019·0 cites·10 claims
- 0736US2009106868A1Atomic force microscope tip shape determination toolCOMMISSARIAT A L ENRGIE ATOMIQ·Filed 2006·Application pending·0 cites
- 0836US2015016708A1Pattern characterisation methodCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →