Inventor · disambiguated record
Johannes Frank
Also filed as: FRANK JOHANNES
7 granted patents·5 pending applications·7 citations·filing 1999–2023
72Inventor score
Top patents by PatentIndex Score
12 records- 0163US12093011B2Method and system for generating an artificial intelligence modelSIEMENS AG·Filed 2019·Granted Sep 17, 2024·1 cites·18 claims
- 0256US2025060702A1Method for Producing Volume Reflection Holograms With Substrate-Guided Reconstruction Beams and/or Substrate-Guided Diffracted Beams in a Single-Beam Set-UpCOVESTRO LLC·Filed 2022·Application pending·0 cites
- 0351US12216454B2Extension device for an automation deviceSIEMENS AG·Filed 2019·Granted Feb 4, 2025·0 cites·18 claims
- 0451US2025155845A1Triarylalkyl Borate Salts as Coinitiators in NIR Photopolymer CompositionsCOVESTRO DEUTSCHLAND AG·Filed 2023·Application pending·0 cites
- 0548US12368779B2Method of communicating with a microservice in an industrial facilitySIEMENS AG·Filed 2022·Granted Jul 22, 2025·0 cites·7 claims
- 0648US2023325205A1System and computer-implemented method to generate a configuration for external datapoint accessSIEMENS AG·Filed 2023·Application pending·0 cites
- 0745US2024291654A1AI Module and Method for Securely Operating an Industrial Control DeviceSIEMENS AG·Filed 2022·Application pending·0 cites
- 0843US2025308878A1Apparatus for accommodating a solid sample materialUNIV WIEN TECH·Filed 2022·Application pending·0 cites
- 0940US11029143B2Method and device for optical surface measurement by means of a chromatic confocal sensorNANOFOCUS AG·Filed 2017·Granted Jun 8, 2021·0 cites·13 claims
- 1034US10627214B2Method for electronically analyzing a signal changing over timeNANOFOCUS AG·Filed 2017·Granted Apr 21, 2020·0 cites·11 claims
- 1131US11255757B2Apparatus and method for analysing a solid specimen materialUNIV WIEN TECH·Filed 2017·Granted Feb 22, 2022·0 cites·12 claims
- 1226US7247272B1Method of the dosed application of a liquid onto a surfaceUNIV DELFT TECH·Filed 1999·Granted Jul 24, 2007·6 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →