Inventor · disambiguated record
John A. Frontiero
Also filed as: FRONTIERO JOHN A
10 granted patents·1 pending application·17 citations·filing 2013–2018
85Inventor score
Top patents by PatentIndex Score
11 records- 0190US9840772B2Method of improving ion beam quality in a non-mass-analyzed ion implantation systemVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2017·Granted Dec 12, 2017·2 cites·20 claims
- 0286US9865430B2Boron implanting using a co-gasVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2015·Granted Jan 9, 2018·3 cites·12 claims
- 0386US9677171B2Method of improving ion beam quality in a non-mass-analyzed ion implantation systemVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2014·Granted Jun 13, 2017·2 cites·16 claims
- 0482US9524849B2Method of improving ion beam quality in an implant systemVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2013·Granted Dec 20, 2016·4 cites·11 claims
- 0580US9887067B2Boron implanting using a co-gasVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2015·Granted Feb 6, 2018·2 cites·13 claims
- 0678US10290466B2Boron implanting using a co-gasVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2017·Granted May 14, 2019·1 cites·19 claims
- 0774US9034743B2Method for implant productivity enhancementVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2013·Granted May 19, 2015·3 cites·14 claims
- 0861US10446371B2Boron implanting using a co-gasVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2018·Granted Oct 15, 2019·0 cites·11 claims
- 0958US10825653B2Method of improving ion beam quality in an implant systemVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2018·Granted Nov 3, 2020·0 cites·14 claims
- 1058US2018087148A1Method Of Improving Ion Beam Quality In A Non-Mass-Analyzed Ion Implantation SystemVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2017·Application pending·0 cites
- 1157US10804075B2Method of improving ion beam quality in an implant systemVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2016·Granted Oct 13, 2020·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →