Inventor · disambiguated record
John R. C. Futrell
Also filed as: FUTRELL JOHN · FUTRELL JOHN R · FUTRELL JOHN R C · FUTRELL JOHN RC
17 granted patents·1 pending application·415 citations·filing 1998–2012
94Inventor score
Top patents by PatentIndex Score
18 records- 0197US6169021B1Method of making a metallized recess in a substrateMICRON TECHNOLOGY INC·Filed 1998·Granted Jan 2, 2001·253 cites·39 claims
- 0288US6238824B1Method for designing and making photolithographic reticle, reticle, and photolithographic processMICRON TECHNOLOGY INC·Filed 1999·Granted May 29, 2001·71 cites·60 claims
- 0375US7096452B2Method and device for checking lithography dataMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 22, 2006·11 cites·32 claims
- 0470US7549143B2Method and device for checking lithography dataMICRON TECHNOLOGY INC·Filed 2006·Granted Jun 16, 2009·2 cites·25 claims
- 0568US8037446B2Methods for defining evaluation points for optical proximity correction and optical proximity correction methods including sameMICRON TECHNOLOGY INC·Filed 2008·Granted Oct 11, 2011·2 cites·13 claims
- 0667US7073161B2Methods of forming patterned reticlesMICRON TECHNOLOGY INC·Filed 2004·Granted Jul 4, 2006·5 cites·8 claims
- 0766US7549142B2Method and device for checking lithography dataMICRON TECHNOLOGY INC·Filed 2006·Granted Jun 16, 2009·7 cites·20 claims
- 0866US7086031B2Methods of forming patterned reticlesMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 1, 2006·5 cites·11 claims
- 0965US6245468B1Optical proximity correction methods, and methods of forming radiation-patterning toolsMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 12, 2001·20 cites·21 claims
- 1063US7093227B2Methods of forming patterned reticlesMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 15, 2006·4 cites·9 claims
- 1163US6842889B2Methods of forming patterned reticlesMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 11, 2005·4 cites·11 claims
- 1261US8584058B2Methods for defining evaluation points for optical proximity correction and optical proximity correction methods including sameFUTRELL JOHN R C·Filed 2011·Granted Nov 12, 2013·1 cites·22 claims
- 1357US6447961B2Optical proximity correction methods, and methods forming radiation-patterning toolsMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 10, 2002·4 cites·14 claims
- 1455US7350182B2Methods of forming patterned reticlesMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 25, 2008·2 cites·14 claims
- 1555US7107572B2Methods of forming patterned reticlesMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 12, 2006·2 cites·27 claims
- 1651US2014104057A1Highway alert safety kitFUTURE 33 LLC·Filed 2012·Application pending·0 cites
- 1750US6248429B1Metallized recess in a substrateMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 19, 2001·12 cites·26 claims
- 1847US6313650B1Insert testing systemMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 6, 2001·10 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →