Inventor · disambiguated record
Jonathan P. G. Gavin
Also filed as: GAVIN JONATHAN P G
2 granted patents·163 citations·filing 2011–2014
68Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0195US9372228B2Non-contact test system for determining whether electronic device structures contain manufacturing faultsAPPLE INC·Filed 2014·Granted Jun 21, 2016·151 cites·20 claims
- 0291US8847617B2Non-contact test system for determining whether electronic device structures contain manufacturing faultsNICKEL JOSHUA G·Filed 2011·Granted Sep 30, 2014·12 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →