Inventor · disambiguated record
John A. Gurley
Also filed as: GURLEY JOHN A
26 granted patents·1 pending application·2,072 citations·filing 1988–1998
98Inventor score
Top patents by PatentIndex Score
27 records- 0197US5412980ATapping atomic force microscopeDIGITAL INSTR INC·Filed 1992·Granted May 9, 1995·215 cites·28 claims
- 0297US5266801AJumping probe microscopeDIGITAL INSTR INC·Filed 1993·Granted Nov 30, 1993·191 cites·19 claims
- 0396US5025658ACompact atomic force microscopeDIGITAL INSTR INC·Filed 1989·Granted Jun 25, 1991·102 cites·32 claims
- 0495US5418363AScanning probe microscope using stored data for vertical probe positioningDIGITAL INSTR INC·Filed 1994·Granted May 23, 1995·119 cites·37 claims
- 0595US5308974AScanning probe microscope using stored data for vertical probe positioningDIGITAL INSTR INC·Filed 1992·Granted May 3, 1994·116 cites·46 claims
- 0693US5519212ATapping atomic force microscope with phase or frequency detectionDIGITAL INSTR INC·Filed 1995·Granted May 21, 1996·182 cites·30 claims
- 0792US5705814AScanning probe microscope having automatic probe exchange and alignmentDIGITAL INSTR INC·Filed 1995·Granted Jan 6, 1998·183 cites·75 claims
- 0891US5229606AJumping probe microscopeDIGITAL INSTR INC·Filed 1989·Granted Jul 20, 1993·72 cites·30 claims
- 0990US5224376AAtomic force microscopeDIGITAL INSTR INC·Filed 1992·Granted Jul 6, 1993·64 cites·11 claims
- 1088US5415027AJumping probe microscopeDIGITAL INSTR INC·Filed 1993·Granted May 16, 1995·62 cites·20 claims
- 1186US5329808AAtomic force microscopeDIGITAL INSTR INC·Filed 1993·Granted Jul 19, 1994·47 cites·4 claims
- 1286US4871938APositioning device for a scanning tunneling microscopeDIGITAL INSTR INC·Filed 1988·Granted Oct 3, 1989·52 cites·35 claims
- 1385US5204531AMethod of adjusting the size of the area scanned by a scanning probeDIGITAL INSTR INC·Filed 1992·Granted Apr 20, 1993·61 cites·27 claims
- 1485US4889988AFeedback control for scanning tunnel microscopesDIGITAL INSTR INC·Filed 1988·Granted Dec 26, 1989·49 cites·43 claims
- 1584US5077473ADrift compensation for scanning probe microscopes using an enhanced probe positioning systemDIGITAL INSTR INC·Filed 1990·Granted Dec 31, 1991·76 cites·17 claims
- 1683US5051646AMethod of driving a piezoelectric scanner linearly with timeDIGITAL INSTR INC·Filed 1990·Granted Sep 24, 1991·55 cites·26 claims
- 1782USRE36488ETapping atomic force microscope with phase or frequency detectionVEECO INSTR INC·Filed 1998·Granted Jan 11, 2000·73 cites·31 claims
- 1881US5189906ACompact atomic force microscopeDIGITAL INSTR INC·Filed 1991·Granted Mar 2, 1993·44 cites·4 claims
- 1979US5898106AMethod and apparatus for obtaining improved vertical metrology measurementsDIGITAL INSTR INC·Filed 1997·Granted Apr 27, 1999·61 cites·68 claims
- 2079US5306919APositioning device for scanning probe microscopesDIGITAL INSTR INC·Filed 1992·Granted Apr 26, 1994·48 cites·28 claims
- 2179US5066858AScanning tunneling microscopes with correction for coupling effectsDIGITAL INSTR INC·Filed 1990·Granted Nov 19, 1991·46 cites·28 claims
- 2278US5198715AScanner for scanning probe microscopes having reduced Z-axis non-linearityDIGITAL INSTR INC·Filed 1991·Granted Mar 30, 1993·45 cites·8 claims
- 2375US5253516AAtomic force microscope for small samples having dual-mode operating capabilityDIGITAL INSTR INC·Filed 1992·Granted Oct 19, 1993·39 cites·7 claims
- 2472US5237859AAtomic force microscopeDIGITAL INSTR INC·Filed 1991·Granted Aug 24, 1993·38 cites·28 claims
- 2569US5314254AStiffness enhancer for movable stage assemblyDIGITAL INSTR·Filed 1992·Granted May 24, 1994·25 cites·31 claims
- 2637USRE37203EFeedback control for scanning tunnel microscopesDIGITAL INSTR INC·Filed 1998·Granted Jun 5, 2001·7 cites·0 claims
- 2730US2002005679A1Method and apparatus for improving a flexure stageFiled 1997·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →