Inventor · disambiguated record
Jong H. Han
Also filed as: HAN JONG H · HAN JONG-HYUNG
2 granted patents·71 citations·filing 1999–2007
66Inventor score
Top patents by PatentIndex Score
2 records- 0187US7752916B2Apparatus and method for material testing of microscale and nanoscale samplesUNIV ILLINOIS·Filed 2007·Granted Jul 13, 2010·22 cites·6 claims
- 0273US6259265B1Unified test system and method for testing printed circuit boardsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jul 10, 2001·49 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →