Inventor · disambiguated record
John P. Hayes
Also filed as: HAYES JOHN P · HAYES JOHN PATRICK
3 granted patents·202 citations·filing 1987–1996
77Inventor score
Top patents by PatentIndex Score
3 records- 0187US4757503ASelf-testing dynamic ramUNIV MICHIGAN·Filed 1987·Granted Jul 12, 1988·71 cites·16 claims
- 0279US5790562ACircuit with built-in test and method thereofGEN MOTORS CORP·Filed 1996·Granted Aug 4, 1998·99 cites·10 claims
- 0367USRE34445ESelf-testing dynamic RAMUNIV MICHIGAN·Filed 1990·Granted Nov 16, 1993·32 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →