Inventor · disambiguated record
Jonathan Hein
Also filed as: HEIN JONATHAN
21 granted patents·5 pending applications·53 citations·filing 2014–2024
93Inventor score
Files withELEMENTAL SCIENTIFIC INC26
Top patents by PatentIndex Score
26 records- 0196US11933698B2System for collecting liquid samples from a distanceELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Mar 19, 2024·3 cites·5 claims
- 0295US11049741B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2018·Granted Jun 29, 2021·8 cites·13 claims
- 0394US11249101B2System for collecting liquid samplesELEMENTAL SCIENTIFIC INC·Filed 2020·Granted Feb 15, 2022·3 cites·14 claims
- 0494US11244841B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2018·Granted Feb 8, 2022·8 cites·20 claims
- 0594US11041835B2System for collecting liquid sampleELEMENTAL SCIENTIFIC INC·Filed 2020·Granted Jun 22, 2021·3 cites·17 claims
- 0693US10585108B2System for collecting liquid samplesELEMENTAL SCIENTIFIC INC·Filed 2016·Granted Mar 10, 2020·5 cites·16 claims
- 0793US10192726B1Rapid inline preparation of a diluted sampleELEMENTAL SCIENTIFIC INC·Filed 2014·Granted Jan 29, 2019·12 cites·18 claims
- 0892US10585075B2System for collecting liquid samplesELEMENTAL SCIENTIFIC INC·Filed 2016·Granted Mar 10, 2020·5 cites·16 claims
- 0991US11804390B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Oct 31, 2023·1 cites·20 claims
- 1089US11476134B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Oct 18, 2022·1 cites·7 claims
- 1188US2025147062A1System for collecting liquid samplesELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 1285US12094738B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2023·Granted Sep 17, 2024·0 cites·20 claims
- 1384US11054344B2System for collecting liquid samples from a distanceELEMENTAL SCIENTIFIC INC·Filed 2015·Granted Jul 6, 2021·3 cites·11 claims
- 1483US11694914B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2022·Granted Jul 4, 2023·0 cites·20 claims
- 1583US2024006201A1Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2023·Application pending·0 cites
- 1681US2024255390A1System for collecting liquid samples from a distanceELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 1780US11971421B2Remote automated chemical crossover system for use with an automated sampling deviceELEMENTAL SCIENTIFIC INC·Filed 2023·Granted Apr 30, 2024·0 cites·13 claims
- 1880US11705351B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2018·Granted Jul 18, 2023·1 cites·17 claims
- 1979US12174211B2System for collecting liquid samplesELEMENTAL SCIENTIFIC INC·Filed 2022·Granted Dec 24, 2024·0 cites·10 claims
- 2076US2025027579A1Valve having integrated sensor and stabilized electrical connectionELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 2175US12366560B2System for collecting liquid samplesELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Jul 22, 2025·0 cites·9 claims
- 2271US12025241B2Valve having integrated sensor and stabilized electrical connectionELEMENTAL SCIENTIFIC INC·Filed 2022·Granted Jul 2, 2024·0 cites·20 claims
- 2371US11056328B2Rapid inline preparation of a diluted sampleELEMENTAL SCIENTIFIC INC·Filed 2020·Granted Jul 6, 2021·0 cites·8 claims
- 2469US11703518B2Remote automated chemical crossover system for use with an automated sampling deviceELEMENTAL SCIENTIFIC INC·Filed 2020·Granted Jul 18, 2023·0 cites·16 claims
- 2567US11519521B1Valve having integrated sensor and stabilized electrical connectionELEMENTAL SCIENTIFIC INC·Filed 2019·Granted Dec 6, 2022·0 cites·15 claims
- 2662US2019214241A1Rapid inline preparation of a diluted sampleELEMENTAL SCIENTIFIC INC·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →