Inventor · disambiguated record
Jorn Heine
Also filed as: HEINE JORN
0 granted patents·3 pending applications·0 citations·filing 2024–2025
Files withABBERIOR INSTRUMENTS GMBH3
Top patents by PatentIndex Score
3 records- 0161US2025277970A1Method, system and localization microscope for aberration correction and for localizing or tracking emittersABBERIOR INSTRUMENTS GMBH·Filed 2025·Application pending·0 cites
- 0257US2024346810A1Light microscopy method, device and computer program productABBERIOR INSTRUMENTS GMBH·Filed 2024·Application pending·0 cites
- 0357US2024346839A1Light microscopy method, device and computer program productABBERIOR INSTRUMENTS GMBH·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →