Inventor · disambiguated record
John W. Hewitt
Also filed as: HEWITT JOHN W
7 granted patents·3 pending applications·34 citations·filing 2010–2018
80Inventor score
Top patents by PatentIndex Score
10 records- 0188US10161893B2Characterization of material under test (MUT) with electromagnetic impedance spectroscopyTRANSTECH SYSTEMS INC·Filed 2015·Granted Dec 25, 2018·5 cites·20 claims
- 0282US9804112B2Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopyTRANSTECH SYSTEMS INC·Filed 2014·Granted Oct 31, 2017·5 cites·18 claims
- 0379US9307935B2Non-invasive monitoring of blood metabolite levelsPLUTA SARAH E·Filed 2010·Granted Apr 12, 2016·21 cites·19 claims
- 0478US10324052B2Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopyTRANSTECH SYSTEMS INC·Filed 2017·Granted Jun 18, 2019·1 cites·19 claims
- 0578US9863900B2Planar sensor array for non-destructive evaluation of material using electromagnetic impedanceTRANSTECH SYSTEMS INC·Filed 2015·Granted Jan 9, 2018·2 cites·12 claims
- 0656US2018128934A1System with Adjustable Linear Electrode Array for Detection and Identification of Buried Objects, Related Computer Program and MethodTRANSTECH SYSTEMS INC·Filed 2018·Application pending·0 cites
- 0750US2016161624A1Method and apparatus for the detection and identification of buried objects using impedance spectroscopy and impedance tomographyTRANSTECH SYSTEMS INC·Filed 2013·Application pending·0 cites
- 0846US2016166187A1Non-invasive monitoring of blood metabolite levelsBIOSENSORS INC·Filed 2016·Application pending·0 cites
- 0940US10739287B2Measurement and monitoring of physical properties of material under test (MUT) from a vehicleTRANSTECH SYSTEMS INC·Filed 2016·Granted Aug 11, 2020·0 cites·17 claims
- 1040US10527570B2Determining location of electromagnetic impedance spectrographic analysis using electromagnetic impedance tomographyTRANSTECH SYSTEMS INC·Filed 2017·Granted Jan 7, 2020·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →