Inventor · disambiguated record
John Hyde
Also filed as: HYDE JOHN · HYDE JOHN E · HYDE JOHN RICHARD
6 granted patents·8 pending applications·29 citations·filing 1981–2024
80Inventor score
Files withFASTCAP SYSTEMS CORP8AMERICAN STANDARD INT INC2CELLCO PARTNERSHIP DBA VERIZON1DETROIT DIESEL CORP1NAT NUCLEAR CORP LTD1
Top patents by PatentIndex Score
14 records- 0192US11676775B2Chip form ultracapacitorFASTCAP SYSTEMS CORP·Filed 2021·Granted Jun 13, 2023·2 cites·18 claims
- 0290US11250996B2Chip form ultracapacitorFASTCAP SYSTEMS CORP·Filed 2018·Granted Feb 15, 2022·6 cites·28 claims
- 0384US2025069821A1Chip form ultracapacitorFASTCAP SYSTEMS CORP·Filed 2024·Application pending·0 cites
- 0479US12165808B2Chip form ultracapacitorFASTCAP SYSTEMS CORP·Filed 2023·Granted Dec 10, 2024·0 cites·18 claims
- 0566US2023360863A1Advanced lithium-ion energy storage deviceFASTCAP SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 0664US2024097134A1Electrodes for energy storage devicesFASTCAP SYSTEMS CORP·Filed 2023·Application pending·0 cites
- 0763US2022165511A1Advanced lithium-ion energy storage deviceFASTCAP SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 0856USD448831SSpray nozzleAMERICAN STANDARD INT INC·Filed 2001·Granted Oct 2, 2001·8 cites·1 claims
- 0947US2014172731A1Floor plan creation and worker assignmentCELLCO PARTNERSHIP DBA VERIZON·Filed 2012·Application pending·0 cites
- 1046US4470950AStorage arrangements for nuclear fuel elementsNAT NUCLEAR CORP LTD·Filed 1981·Granted Sep 11, 1984·10 cites·10 claims
- 1146US2023187702A1Wide temperature electrolyteFASTCAP SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 1238USD442257SSpray nozzleAMERICAN STANDARD INT INC·Filed 2000·Granted May 15, 2001·3 cites·1 claims
- 1335US2004113081A1Gas velocity measurement by infrared radiation absorptionFiled 2002·Application pending·0 cites
- 1432US2003056737A1Engine cooling system with coolant shuntDETROIT DIESEL CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →