Inventor · disambiguated record
Jong Goo Jung
Also filed as: JUNG JONG GOO
10 granted patents·1 pending application·34 citations·filing 2002–2009
85Inventor score
Top patents by PatentIndex Score
11 records- 0166US8252686B2Method for forming copper wiring in a semiconductor devicePARK HYUNG SOON·Filed 2009·Granted Aug 28, 2012·3 cites·48 claims
- 0264US6723655B2Methods for fabricating a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Apr 20, 2004·10 cites·13 claims
- 0361US7271088B2Slurry composition with high planarity and CMP process of dielectric film using the sameHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Sep 18, 2007·7 cites·14 claims
- 0455US7855109B2Method for manufacturing a semiconductor device capable of preventing the generation of a bridge between a recess gate and a PLC plugHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Dec 21, 2010·1 cites·16 claims
- 0552US6864177B2Method for manufacturing metal line contact plug of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Mar 8, 2005·7 cites·20 claims
- 0649US7199053B2Method for detecting end-point of chemical mechanical polishing processHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Apr 3, 2007·3 cites·16 claims
- 0748US7018924B2CMP slurry compositions for oxide films and methods for forming metal line contact plugs using the sameHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Mar 28, 2006·2 cites·17 claims
- 0843US2008242084A1Method for planarizing an insulation layer in a semiconductor device capable of omitting a mask process and an etching processKIM HYUNG HWAN·Filed 2007·Application pending·0 cites
- 0942US8841198B2Isolation layer having a bilayer structure for a semiconductor device and method for forming the sameKIM HYUNG HWAN·Filed 2008·Granted Sep 23, 2014·0 cites·14 claims
- 1041US7056803B2Method for forming capacitor of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jun 6, 2006·1 cites·15 claims
- 1136US7081396B2Method for manufacturing device isolation film of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Jul 25, 2006·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →