Inventor · disambiguated record
Jong-An Kim
Also filed as: KIM JONG AN
16 granted patents·3 pending applications·94 citations·filing 1995–2024
91Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9DONGWON SYS CORP2KIM JONG-AN1KIM JONG-HEUM1KOREA ELECTRIC POWER CORP1
Top patents by PatentIndex Score
19 records- 0182US8126258B2Method of detecting defects in patterns on semiconductor substrate by comparing second image with reference image after acquiring second image from first image and apparatus for performing the sameYANG YU-SIN·Filed 2007·Granted Feb 28, 2012·9 cites·12 claims
- 0282US8050488B2Method of analyzing a wafer sampleSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 1, 2011·6 cites·12 claims
- 0379US8034640B2Apparatus and method to inspect defect of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Oct 11, 2011·5 cites·19 claims
- 0478US8153339B2Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the maskKIM JONG-AN·Filed 2010·Granted Apr 10, 2012·6 cites·7 claims
- 0577US7767506B2Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the maskSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Aug 3, 2010·6 cites·8 claims
- 0677US7449352B2Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the maskSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 11, 2008·6 cites·10 claims
- 0772US7728966B2Optical inspection tool having lens unit with multiple beam paths for detecting surface defects of a substrate and methods of using sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 1, 2010·4 cites·31 claims
- 0872US6074974AManufacturing method of granulated complex molecular sieve composition having multi-functionsKOREA RES INST CHEM TECH·Filed 1995·Granted Jun 13, 2000·43 cites·4 claims
- 0970US8055056B2Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Nov 8, 2011·3 cites·14 claims
- 1070US7804591B2Wafer inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Sep 28, 2010·3 cites·12 claims
- 1165US8055057B2Method for detecting defects in a substrate having a semiconductor device thereonSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 8, 2011·2 cites·14 claims
- 1255US2025192289A1Cell pouch for secondary battery and its manufacturing methodDONGWON SYS CORP·Filed 2024·Application pending·0 cites
- 1354US2025096373A1Cell pouch for secondary battery and its manufacturing methodDONGWON SYS CORP·Filed 2023·Application pending·0 cites
- 1445US8546154B2Apparatus and method to inspect defect of semiconductor deviceSHIN JI-YOUNG·Filed 2011·Granted Oct 1, 2013·0 cites·9 claims
- 1545US2014172816A1Search user interfaceKT CORP·Filed 2013·Application pending·0 cites
- 1643US8769292B2Method for generating standard file based on steganography technology and apparatus and method for validating integrity of metadata in the standard fileKIM JONG-HEUM·Filed 2008·Granted Jul 1, 2014·1 cites·9 claims
- 1742US10989520B2Methods for nondestructive measurements of thickness of underlying layersSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Apr 27, 2021·0 cites·17 claims
- 1840US11043814B2Apparatus for controlling ESS according to transient stability state and method thereofKOREA ELECTRIC POWER CORP·Filed 2017·Granted Jun 22, 2021·0 cites·11 claims
- 1936US9045349B2Method for preparing porous aluminaSUH JEONG KWON·Filed 2012·Granted Jun 2, 2015·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →