Inventor · disambiguated record
Jong Chol Kim
Also filed as: KIM JONG C · KIM JONG CHOL
11 granted patents·1 pending application·126 citations·filing 1994–2023
87Inventor score
Top patents by PatentIndex Score
12 records- 0195US10217816B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 26, 2019·15 cites·16 claims
- 0291US5441904AMethod for forming a two-layered polysilicon gate electrode in a semiconductor device using grain boundariesHYUNDAI ELECTRONICS IND·Filed 1994·Granted Aug 15, 1995·107 cites·11 claims
- 0385US11515391B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 29, 2022·1 cites·20 claims
- 0480US11133311B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Sep 28, 2021·2 cites·20 claims
- 0579US12471366B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·28 claims
- 0670US11581311B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 0769US11876097B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jan 16, 2024·0 cites·20 claims
- 0864US10714473B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 14, 2020·0 cites·20 claims
- 0964US10311187B2Circuit design method and simulation method based on random telegraph signal noiseSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jun 4, 2019·1 cites·20 claims
- 1060US10840332B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 17, 2020·0 cites·20 claims
- 1156US10504894B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 10, 2019·0 cites·18 claims
- 1237US2017103154A1Circuit design method and simulation method based on process variation caused by agingSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →