Inventor · disambiguated record
Joseph J. Kopanski
Also filed as: KOPANSKI JOSEPH J
2 granted patents·133 citations·filing 1995–2015
60Inventor score
Top patents by PatentIndex Score
2 records- 0190US5617340AMethod and reference standards for measuring overlay in multilayer structures, and for calibrating imaging equipment as used in semiconductor manufacturingUS COMMERCE·Filed 1995·Granted Apr 1, 1997·133 cites·36 claims
- 0240US10152666B2Authentication article and process for making sameNATIONAL INSTITUTE OF STANDARDS AND TECH·Filed 2015·Granted Dec 11, 2018·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →