Inventor · disambiguated record
Joseph Ku
Also filed as: KU JOSEPH · KU JOSEPH W · KU JOSEPH WEIYEH
22 granted patents·649 citations·filing 1998–2010
96Inventor score
Top patents by PatentIndex Score
22 records- 0197US7183924B1Storing configuration information and a service record for an item in an RFID tagHEWLETT PACKARD DEVELOPMENT CO·Filed 2005·Granted Feb 27, 2007·145 cites·19 claims
- 0295US8631247B2System and method for hardware based securityO'LOUGHLIN DANIEL·Filed 2009·Granted Jan 14, 2014·123 cites·18 claims
- 0393US7432816B1Printed circuit board with RFID antennaHEWLETT PACKARD DEVELOPMENT CO·Filed 2005·Granted Oct 7, 2008·37 cites·17 claims
- 0493US6492854B1Power efficient and high performance flip-flopHEWLETT PACKARD CO·Filed 2001·Granted Dec 10, 2002·60 cites·18 claims
- 0593US6351172B1High-speed output driver with an impedance adjustment schemeDMEL INC·Filed 2000·Granted Feb 26, 2002·83 cites·17 claims
- 0690US8606206B1Traveling wave beamforming networkLAM LAWRENCE K·Filed 2010·Granted Dec 10, 2013·10 cites·20 claims
- 0781US6384331B1Secured reinforcing support device for a heat sinkMICRO STAR INT CO LTD·Filed 2001·Granted May 7, 2002·35 cites·8 claims
- 0876US6910155B2System and method for chip testingHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Jun 21, 2005·23 cites·31 claims
- 0976US6907534B2Minimizing power consumption in pipelined circuit by shutting down pipelined circuit in response to predetermined period of time having expiredHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Jun 14, 2005·22 cites·21 claims
- 1068US6347029B1Over-current protection circuit for linear voltage regulatorsDMEL INC·Filed 1999·Granted Feb 12, 2002·31 cites·7 claims
- 1162US7248518B2Self-timed memory device providing adequate charging time for selected heaviest loading rowHEWLETT PACKARD DEVELOPMENT CO·Filed 2005·Granted Jul 24, 2007·4 cites·11 claims
- 1262US6874014B2Chip multiprocessor with multiple operating systemsHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Mar 29, 2005·12 cites·19 claims
- 1361US7087439B2Method and apparatus for thermally assisted testing of integrated circuitsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Aug 8, 2006·7 cites·25 claims
- 1461US6600328B2Analog method and circuit for monitoring digital events performanceHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Jul 29, 2003·9 cites·24 claims
- 1559US6889349B2Digital event sampling circuit and methodHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted May 3, 2005·5 cites·26 claims
- 1659US6851064B2Fine-grained thermal control in memory subsystemsHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Feb 1, 2005·6 cites·31 claims
- 1758US6940770B2Method for precharging word and bit lines for selecting memory cells within a memory arrayHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Sep 6, 2005·8 cites·15 claims
- 1850US6982197B2Method and apparatus for building up large scale on chip de-coupling capacitor on standard CMOS/SOI technologyHEWLETT PACKARD DEVELOPMENT CO·Filed 2002·Granted Jan 3, 2006·5 cites·19 claims
- 1949US6504746B2High-density low-cost read-only memory circuitHEWLETT PACKARD CO·Filed 2001·Granted Jan 7, 2003·3 cites·14 claims
- 2046US6826112B2Low power logic gateHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Nov 30, 2004·3 cites·28 claims
- 2144US6886117B2Field repairable embedded memory in system-on-a-chipHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Apr 26, 2005·4 cites·24 claims
- 2241US6145062ASelective conflict write flushINTEL CORP·Filed 1998·Granted Nov 7, 2000·14 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →