Inventor · disambiguated record
Joseph Duane Kulesza
Also filed as: KOZLOWSKI RICHARD MICHAEL · KULESZA JOSEPH D · KULESZA JOSEPH DUANE · SABIA JOSEPH GENE
13 granted patents·1 pending application·531 citations·filing 1993–2011
94Inventor score
Top patents by PatentIndex Score
14 records- 0196US7551058B1Sensor for monitoring environmental parameters in concreteADVANCED DESIGN CONSULTING USA·Filed 2003·Granted Jun 23, 2009·97 cites·20 claims
- 0294US7143644B2Device for collecting statistical data for maintenance of small-armsADVANCED DESIGN CONSULTING USA·Filed 2004·Granted Dec 5, 2006·101 cites·39 claims
- 0391US7100437B2Device for collecting statistical data for maintenance of small-armsADVANCED DESIGN CONSULTING USA·Filed 2003·Granted Sep 5, 2006·53 cites·51 claims
- 0488US7264649B1System for allergen reduction through indoor humidity controlADVANCED DESIGN CONSULTING USA·Filed 2004·Granted Sep 4, 2007·54 cites·20 claims
- 0584US6527686B1Variable pitch spindle line drilling machineIBM·Filed 2000·Granted Mar 4, 2003·21 cites·20 claims
- 0683US5571593AVia fill compositions for direct attach of devices and methods for applying sameIBM·Filed 1995·Granted Nov 5, 1996·53 cites·7 claims
- 0778US6106891AVia fill compositions for direct attach of devices and method for applying sameIBM·Filed 1998·Granted Aug 22, 2000·38 cites·6 claims
- 0877US5766670AVia fill compositions for direct attach of devices and methods for applying sameIBM·Filed 1993·Granted Jun 16, 1998·39 cites·3 claims
- 0965US5887345AMethod for applying curable fill compositon to apertures in a substrateIBM·Filed 1997·Granted Mar 30, 1999·21 cites·4 claims
- 1064US6194024B1Via fill compositions for direct attach of devices and methods for applying sameIBM·Filed 1995·Granted Feb 27, 2001·26 cites·4 claims
- 1151US7019522B1Apparatus for measuring the magnetic field produced by an insertion deviceADVANCED DESIGN CONSULTING USA·Filed 2004·Granted Mar 28, 2006·5 cites·24 claims
- 1245US5865769ASurface contour measurement instrumentIBM·Filed 1996·Granted Feb 2, 1999·17 cites·9 claims
- 1340US2013099881A1Short period super-mini undulatorDEYHIM ALEX K·Filed 2011·Application pending·0 cites
- 1430US5957868ASurface contour measurement instrumentIBM·Filed 1998·Granted Sep 28, 1999·6 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →