Inventor · disambiguated record
Jon Lee
Also filed as: LEE JON · LEE JON C · LEE JON-CHEN
2 granted patents·1 pending application·13 citations·filing 2003–2020
50Inventor score
Top patents by PatentIndex Score
3 records- 0159US6930502B2Method using conductive atomic force microscopy to measure contact leakage currentTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Aug 16, 2005·13 cites·18 claims
- 0239US2022015881A1Toothpick structureLEE JON CHEN·Filed 2020·Application pending·0 cites
- 0336US8659890B2eUSB duplication systemLEE JON·Filed 2011·Granted Feb 25, 2014·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →