Inventor · disambiguated record
Joon Hyub Lee
Also filed as: LEE JOON · LEE JOON H · LEE JOON HYUB
6 granted patents·4 pending applications·39 citations·filing 2005–2022
76Inventor score
Files withKOREA ADVANCED INST SCI & TECH5HR TEXTRON INC2MAESTRO CO LTD1WOODWARD HRT INC1WOODWARD INC1
Top patents by PatentIndex Score
10 records- 0188US7283934B2Acceptance testing of actuators using predetermined thresholdsHR TEXTRON INC·Filed 2005·Granted Oct 16, 2007·21 cites·20 claims
- 0286US7292954B2Acceptance testing of actuators using backlash and stiction measurementsHR TEXTRON INC·Filed 2005·Granted Nov 6, 2007·18 cites·22 claims
- 0354US9325262B2Brushless motors with linear hall sensorsWOODWARD INC·Filed 2014·Granted Apr 26, 2016·0 cites·12 claims
- 0449US2025037399A1Electronic device for carrying out three-dimensional sketching and operation method thereofKOREA ADVANCED INST SCI & TECH·Filed 2022·Application pending·0 cites
- 0548US11508129B23D window management method using projective geometry in augmented reality and virtual realityKOREA ADVANCED INST SCI & TECH·Filed 2018·Granted Nov 22, 2022·0 cites·14 claims
- 0644US2024420436A1Electronic system for performing control over virtual reality space, electronic device, and method for operating sameKOREA ADVANCED INST SCI & TECH·Filed 2021·Application pending·0 cites
- 0743US2025103141A1Electronic System for Controlling Memo Object in Virtual Space and Operating Method ThereofKOREA ADVANCED INST SCI & TECH·Filed 2022·Application pending·0 cites
- 0839US12151363B2Object control method and object control deviceKOREA ADVANCED INST SCI & TECH·Filed 2019·Granted Nov 26, 2024·0 cites·13 claims
- 0939US2019223745A1Apparatus and method of measuring fatigueMAESTRO CO LTD·Filed 2018·Application pending·0 cites
- 1038US7956619B2Testing an inductive load of a device using a modulated signalWOODWARD HRT INC·Filed 2007·Granted Jun 7, 2011·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Joon Hyub Lee files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →