Inventor · disambiguated record
Jong-Eon Lee
Also filed as: LEE JONG-EON
10 granted patents·1 pending application·186 citations·filing 2001–2008
88Inventor score
Top patents by PatentIndex Score
11 records- 0194US6560158B2Power down voltage control method and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted May 6, 2003·101 cites·30 claims
- 0287US6510096B2Power down voltage control method and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jan 21, 2003·44 cites·28 claims
- 0383US7345939B2Sense amplifiers having MOS transistors therein with different threshold voltages and/or that support different threshold voltage biasingSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 18, 2008·13 cites·3 claims
- 0479US7259978B2Semiconductor memory devices and signal line arrangements and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Aug 21, 2007·12 cites·30 claims
- 0562US7511551B2Voltage converter and method of performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 31, 2009·10 cites·40 claims
- 0659US7551513B2Semiconductor memory device and method of controlling sub word line driver thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 23, 2009·5 cites·6 claims
- 0740US7710807B2Sense amplifiers having MOS transistors therein with different threshold voltages and/or that support different threshold voltage biasingSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted May 4, 2010·0 cites·34 claims
- 0838US2005248042A1Semiconductor memory deviceLEE JONG-EON·Filed 2005·Application pending·0 cites
- 0937US7348789B2Integrated circuit device with on-chip setup/hold measuring circuitSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 25, 2008·1 cites·20 claims
- 1032US6452828B1Dynamic random access memory (DRAM) having a structure for emplying a word line low voltageSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Sep 17, 2002·0 cites·10 claims
- 1131US6473325B2Bit line sensing control circuit for a semiconductor memory device and layout of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 29, 2002·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →