Inventor · disambiguated record
Joseph W. Lyding
Also filed as: LYDING JOSEPH W
15 granted patents·5 pending applications·455 citations·filing 1988–2022
94Inventor score
Top patents by PatentIndex Score
20 records- 0197US7651797B2Electrochemical cells comprising laminar flow induced dynamic conducting interfaces, electronic devices comprising such cells, and methods employing sameUNIV ILLINOIS·Filed 2005·Granted Jan 26, 2010·34 cites·12 claims
- 0296US6713206B2Electrochemical cells comprising laminar flow induced dynamic conducting interfaces, electronic devices comprising such cells, and methods employing sameUNIV ILLINOIS·Filed 2002·Granted Mar 30, 2004·101 cites·36 claims
- 0394US5872387ADeuterium-treated semiconductor devicesUNIV ILLINOIS·Filed 1996·Granted Feb 16, 1999·114 cites·2 claims
- 0490US6147014AForming of deuterium containing nitride spacers and fabrication of semiconductor devicesUNIV ILLINOIS·Filed 1998·Granted Nov 14, 2000·65 cites·8 claims
- 0589US6833306B2Deuterium treatment of semiconductor deviceUNIV ILLINOIS·Filed 2002·Granted Dec 21, 2004·51 cites·26 claims
- 0688US10060948B2Scanning probe and electron microscope probes and their manufactureTIPTEK LLC·Filed 2016·Granted Aug 28, 2018·3 cites·20 claims
- 0787US6444533B1Semiconductor devices and methods for sameUNIV ILLINOIS·Filed 2000·Granted Sep 3, 2002·36 cites·8 claims
- 0885US8819861B2Nanometer-scale sharpening of conductor tipsLYDING JOSEPH W·Filed 2011·Granted Aug 26, 2014·8 cites·22 claims
- 0977US8070920B2Nanometer-scale sharpening of conductor tipsLYDING JOSEPH W·Filed 2007·Granted Dec 6, 2011·7 cites·24 claims
- 1069US4841148AVariable temperature scanning tunneling microscopeUNIV ILLINOIS·Filed 1988·Granted Jun 20, 1989·24 cites·6 claims
- 1168US2022128595A1Scanning Probe and Electron Microscope Probes and Their ManufactureTIPTEK LLC·Filed 2022·Application pending·0 cites
- 1266US11237188B2Scanning probe and electron microscope probes and their manufactureTIPTEK LLC·Filed 2018·Granted Feb 1, 2022·0 cites·17 claims
- 1362US11169177B2Scanning probe and electron microscope probes and their manufactureTIPTEK LLC·Filed 2017·Granted Nov 9, 2021·0 cites·21 claims
- 1460US8283090B2Electrochemical cells comprising laminar flow induced dynamic conducting interfaces, electronic devices comprising such cells, and methods employing sameMARKOSKI LARRY J·Filed 2007·Granted Oct 9, 2012·0 cites·14 claims
- 1559US2023072987A1Printed structure comprising aligned carbon nanotubes for electromagnetic interference (emi) shieldingUNIV ILLINOIS·Filed 2022·Application pending·0 cites
- 1657US6888204B1Semiconductor devices, and methods for sameUNIV ILLINOIS·Filed 1998·Granted May 3, 2005·12 cites·18 claims
- 1755US11923140B2Carbon-metal oxide composite electrode for a supercapacitor and method of making a carbon-metal oxide composite electrodeUNIV ILLINOIS·Filed 2021·Granted Mar 5, 2024·0 cites·5 claims
- 1843US2020176248A1Surface contaminant reduction in controlled environmentsZYVEX LABS LLC·Filed 2019·Application pending·0 cites
- 1939US2014166545A1Asymmetric magnetic field nanostructure separation method, device and systemLYDING JOSEPH W·Filed 2012·Application pending·0 cites
- 2036US2002031920A1Deuterium treatment of semiconductor devicesFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →