Inventor · disambiguated record
John Magana
Also filed as: MAGANA JOHN · MAGANA JOHN F · MAGANA JOHN FERDINAND
8 granted patents·3 pending applications·38 citations·filing 2002–2022
80Inventor score
Top patents by PatentIndex Score
11 records- 0195US11194246B1Monolithically framed pellicle membrane suitable for lithography in the fabrication of integrated circuitsINTEL CORP·Filed 2020·Granted Dec 7, 2021·4 cites·21 claims
- 0293US12209975B2Real-time detection of deflections and ruptures of EUV pellicle membranesINTEL CORP·Filed 2022·Granted Jan 28, 2025·2 cites·12 claims
- 0383US6891592B2Wafer level electro-optical sort testing and wafer level assembly of micro liquid crystal-on silicon (LCOS) devicesINTEL CORP·Filed 2002·Granted May 10, 2005·30 cites·27 claims
- 0474US11561466B2Monolithically framed pellicle membrane suitable for lithography in the fabrication of integrated circuitsINTEL CORP·Filed 2021·Granted Jan 24, 2023·0 cites·20 claims
- 0558US11604406B2Method and apparatus for fabrication of very large scale integration pattern features via electroless deposition on extreme ultraviolet lithography photomasksINTEL CORP·Filed 2019·Granted Mar 14, 2023·0 cites·22 claims
- 0658US8072016B2EPI substrate with low doped EPI layer and high doped Si substrate layer for media growth on EPI and low contact resistance to back-side substrateJAIN AJAY·Filed 2008·Granted Dec 6, 2011·0 cites·19 claims
- 0753US11300885B2EUV phase-shift SRAF masks by means of embedded phase shift layersINTEL CORP·Filed 2018·Granted Apr 12, 2022·0 cites·24 claims
- 0851US2023367204A1System and method for reducing pellicle ruptureINTEL CORP·Filed 2022·Application pending·0 cites
- 0947US2009001488A1Cantilever with integral probe tipMAGANA JOHN·Filed 2007·Application pending·0 cites
- 1045US7692757B2Wafer scale fabrication of liquid crystal on silicon light modulation devicesINTEL CORP·Filed 2004·Granted Apr 6, 2010·2 cites·6 claims
- 1141US2020050097A1Novel method for fabrication of euv photomask fiducialsINTEL CORP·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →