Inventor · disambiguated record
John Mcnitt
Also filed as: MCNITT JOHN · MCNITT JOHN L · MCNITT JOHN LYNN
10 granted patents·2 pending applications·171 citations·filing 2000–2019
89Inventor score
Files withLSI LOGIC CORP7AVAGO TECH INT SALES PTE LID1AVAGO TECHNOLOGIES GENERAL IP1BROADCOM CORP1THOMPSON KERRY1
Top patents by PatentIndex Score
12 records- 0190US11101674B2Battery charging architecturesAVAGO TECHNOLOGIES GENERAL IP·Filed 2017·Granted Aug 24, 2021·11 cites·20 claims
- 0289US6897673B2Method and integrated circuit for capacitor measurement with digital readoutLSI LOGIC CORP·Filed 2003·Granted May 24, 2005·53 cites·10 claims
- 0387US6424200B1Termination impedance trimming circuitLSI LOGIC CORP·Filed 2000·Granted Jul 23, 2002·60 cites·16 claims
- 0483US6842058B2Method and apparatus for slew control of an output signalLSI LOGIC CORP·Filed 2002·Granted Jan 11, 2005·30 cites·10 claims
- 0564US9190854B2Charger external power device gain samplingTHOMPSON KERRY·Filed 2012·Granted Nov 17, 2015·3 cites·21 claims
- 0654US7081762B2Method and apparatus for measuring high speed glitch energy in an integrated circuitLSI LOGIC CORP·Filed 2003·Granted Jul 25, 2006·6 cites·13 claims
- 0749US2016049807A1Charger External Power Device Gain SamplingBROADCOM CORP·Filed 2015·Application pending·0 cites
- 0848US6559704B1Inverting level shifter with start-up circuitLSI LOGIC CORP·Filed 2001·Granted May 6, 2003·4 cites·11 claims
- 0945US10775819B2Multi-loop voltage regulator with load tracking compensationAVAGO TECH INT SALES PTE LID·Filed 2019·Granted Sep 15, 2020·0 cites·19 claims
- 1042US6870386B1Method and apparatus for measuring sheet resistanceLSI LOGIC CORP·Filed 2003·Granted Mar 22, 2005·2 cites·19 claims
- 1141US6771110B2Inverting level shifter with start-up circuitLSI LOGIC CORP·Filed 2003·Granted Aug 3, 2004·2 cites·19 claims
- 1231US2005024125A1Highly efficient, high current drive, multi-phase voltage multiplierFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →