Inventor · disambiguated record
John Moffitt
Also filed as: MOFFITT JOHN · MOFFITT JOHN STUART
11 granted patents·84 citations·filing 1975–2023
88Inventor score
Top patents by PatentIndex Score
11 records- 0194US10545096B1Marco inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Jan 28, 2020·7 cites·6 claims
- 0286US4025023ABurster apparatusIBM·Filed 1975·Granted May 24, 1977·27 cites·12 claims
- 0385US10915992B1System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2019·Granted Feb 9, 2021·3 cites·20 claims
- 0481US4069957ABurster methodIBM·Filed 1976·Granted Jan 24, 1978·28 cites·2 claims
- 0576US11656184B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2022·Granted May 23, 2023·0 cites·20 claims
- 0674US11995802B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2023·Granted May 28, 2024·0 cites·20 claims
- 0772US4065123AApparatus for stacking documents in sequenceIBM·Filed 1976·Granted Dec 27, 1977·19 cites·20 claims
- 0870US11663703B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2022·Granted May 30, 2023·0 cites·20 claims
- 0970US11341617B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2021·Granted May 24, 2022·0 cites·20 claims
- 1065US11408829B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 9, 2022·0 cites·20 claims
- 1162US10914686B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2020·Granted Feb 9, 2021·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when John Moffitt files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →