Inventor · disambiguated record
John L. Nistler
Also filed as: NISTLER JOHN L · NISTLER JOHN LEE
14 granted patents·660 citations·filing 1992–2002
94Inventor score
Top patents by PatentIndex Score
14 records- 0195US6210999B1Method and test structure for low-temperature integration of high dielectric constant gate dielectrics into self-aligned semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1998·Granted Apr 3, 2001·211 cites·28 claims
- 0294US6297644B1Multipurpose defect test structure with switchable voltage contrast capability and method of useADVANCED MICRO DEVICES INC·Filed 1999·Granted Oct 2, 2001·135 cites·30 claims
- 0388US6452180B1Infrared inspection for determining residual films on semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 17, 2002·38 cites·31 claims
- 0485US6226781B1Modifying a design layer of an integrated circuit using overlying and underlying design layersADVANCED MICRO DEVICES INC·Filed 1998·Granted May 1, 2001·73 cites·18 claims
- 0582US6072222ASilicon implantation into selective areas of a refractory metal to reduce consumption of silicon-based junctions during salicide formationADVANCED MICRO DEVICES INC·Filed 1998·Granted Jun 6, 2000·65 cites·6 claims
- 0680US5308722AVoting technique for the manufacture of defect-free printing phase shift lithographyADVANCED MICRO DEVICES INC·Filed 1992·Granted May 3, 1994·38 cites·21 claims
- 0776US6096616AFabrication of a non-ldd graded p-channel mosfetADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 1, 2000·39 cites·15 claims
- 0865US6780568B1Phase-shift photomask for patterning high density featuresADVANCED MICRON DEVICES INC·Filed 2002·Granted Aug 24, 2004·7 cites·3 claims
- 0964US6410191B1Phase-shift photomask for patterning high density featuresADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 25, 2002·20 cites·17 claims
- 1049US6750544B1Metallization system for use in a semiconductor componentADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 15, 2004·3 cites·8 claims
- 1146US6083272AMethod of adjusting currents on a semiconductor device having transistors of varying densityADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 4, 2000·12 cites·24 claims
- 1243US5990488AUseable drop-in strategy for correct electrical analysis of semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1999·Granted Nov 23, 1999·12 cites·21 claims
- 1335US6188233B1Method for determining proximity effects on electrical characteristics of semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1998·Granted Feb 13, 2001·4 cites·25 claims
- 1433US6562521B1Semiconductor feature having support islandsADVANCED MICRO DEVICES INC·Filed 1999·Granted May 13, 2003·3 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →